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Thermal assisted switching magnetic tunnel junctions as FPGA memory elements

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This paper presents our research and development work on new circuits and topologies based on Magnetic RAM for use as configuration memory elements of reconfigurable arrays. MRAM provides non volatility with cell areas and with access speeds comparable to those of SRAM and with lower process complexity than FLASH memories. The new memory cells take advantage of the Thermal Assisted Switching (TAS) writing technique to solve the drawbacks of the more common Field Induced Magnetic Switching writing technique. The CMOS circuit structures to implement the main components for reading and writing the MTJ cells have been developed, characterized and evaluated. A scaled down prototype of a coarse grain reconfigurable array that employs the TAS-MRAM elements as configuration memory has been designed and electrically simulated pre- and post- layout. The results obtained for all the circuit elements, namely the storage cells and the current generators, indicate that the new configuration memory cells can provide a very promising technological solution for run-time reconfigurable hardware devices. The prototype has been manufactured using a standard process 0.35μm 4-Metal CMOS process technology and should be under test in the foreseeable future.
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Bibliografia
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  • [6] Weisheng ZHAO, Eric Belhaire, Bernard Dieny, Guillaume Prenat, Claude Chappert, "TAS-MRAM based Non-volatile FPGA logic circuit", International Conference on Field-Programmable Technology (ICFPT 2007), pp. 153-160, IEEE, 2007.
  • [7] Yoann Guillemenet, Lionel Torres, Gilles Sassatelli, Nicholas Bruchon, Ilham Hassoune, "A Non-volatile Run-Time FPGA using Thermally Assisted Switching MRAMS", International Conference on Field-Programmable Logic and Applications (FPL 2008), pp. 421-426, IEEE, 2008.
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Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-LOD6-0019-0006
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