Consolidating condition of Cr-Si compacts and their microstructure

• Autorzy: Morgiel J. , Mania R. , Grzonka J. , Rogal Ł. , Janus A. M. , Zientara D.
• Języki publikacji: EN

Abstrakty

EN

Purpose: Determine the possibility of production of CrSi compacts from Cr and si elemental powders. Design/methodology/approach: The CrSi compacts containing 0.5, 1, 2, 3, at. % of Si were prepared from elemental powders (crystallites size:Cr;1-5 µm and Si;45 µm) by mixing and hot pressing at 1600*C under ∼ 25MPa. The microstructure was characterized using optical, SEM and TEM. Findings: The matrix of the compacts containing silicon show presence of dendrite like areas filled with eutectic like mixture of amorphous SiO2 and crystalline CrOx. The dendrite volume increase from 0.7% to 2% for Cr0.5Si to Cr3Si compacts respectively. Research limitations/implications: (Please leave in the title a suitable word); (Could you please put your information in this box): If research is reported in the paper this section must be completed and should include suggestions for future research and any identified limitations in the research process. Practical implications: The described experiments advice on preparation of dense CrSi compacts from elemental powders. It may be used as technology of producing magnetron targets for deposition of hard coatings like CrN/Si3N4. Originality/value: The paper is answering the problem, i.e. describes the optimum parameters, of obtaining of the multi-elemental coating in single target magnetron systems.

Słowa kluczowe

EN

metallography; CrSi compacts; hot pressing; microstructure; optical microscopy

PL

metalografia; prasowanie na gorąco; mikrostruktura; mikroskopia optyczna

• Wydawca: International OCSCO World Press
• Czasopismo: Archives of Materials Science and Engineering
• Rocznik: 2007
• Tom: Vol. 28, nr 11
• Strony: 673--676
• Opis fizyczny: Bibliogr. 13 poz., il., wykr.

Twórcy

autor

Morgiel J.

autor

Mania R.

autor

Grzonka J.

autor

Rogal Ł.

autor

Janus A. M.

autor

Zientara D.

• Institute of Metallurgy and Materials Science of the Polish Academy of Sciences, ul. W. Reymonta 25, 30-059 Kraków, Poland,

Bibliografia

• [1] J. Patscheider, Nanocomposite Hard coatings for wear protection, MRS Bulletin 28(2003)180.
• [2] S. Zhang, X. Lam Bui, Y. Fu, Magnetron sputtered nc-TiC/a-C(Al) tough nano-composite coatings, Thin Solid Films 467 (2004) 261-266.
• [3] E. Martinez, R. Sanjine, O. Banakh, F. Le'vy, An electrical, optical and mechanical properties of sputtered CrNy and Cr1yxSixN1.02 thin films; Thin Solid Films 447-448 (2004) 332-336.
• [4] J. Morgiel, R. Mania, Ł. Major, J. Grzonka, Elaboration of magnetron deposited conditions of c-TiN/a-Si3N4 nanocomposite coatings, Maintnance Problems 61 (2006) 33-42.
• [5] J. Morgiel, S. Zimowski, R. Mania, M. Kot, J. Grzonka, Ł. Major, Microstructure and mechanical properties of nanocomposite nc-TiN/a-Si3N4 coatings on stainless and high speed steels, Materials Engineering 157-158 (2007) 692-697.
• [6] R. Mania, J. Morgiel, M. Dąbrowski, S. Zimowski, J. Grzonka, Duplex type coatings from Ti-Si-N system applied on WC cutting plates, Maintnance Problems 63 (2006) 81-90.
• [7] L. A. Dobrzański, L. W. Żukowska, Properties of multicomponent and graient PVD coatings, Archives of Materials Science and Engineering 28/10 (2007) 621-624.
• [8] L. A. Dobrzański, K. Lukaszkowicz, D. Pakuła, J. Mikuła, Corossion resistance of multilayer and gradient coatings deposited by PVD and CVD techniques, Archives of Materials Science and Engineering 28/1 (2007) 12-18.
• [9] L. A. Dobrzański, K. Lukaszkowicz, Mechanical properties of monolayer coatings deposited by PVD techniques, Archives of Materials Science and Engineering 28/9 (2007) 549-556.
• [10] L. A. Giannuzzi, F. A. Stevie, Review of focused ion beam milling techniques fro TEM specimen preparation, Micron 30 (1999) 197-2004.
• [11] H. White, Y. Pu, M. Rafailovich, J. Sokolov, A. H. King, L. A. Giannuzzi, C. Urbanik-Shannon, B. W. Kempshall, A. Eisenberg, S. A. Schwarz, Y. M. Strzhemechny, Focused ion beam/ lift-out transmission electron microscopy cross sections of block copolymer films ordered on silicon substrates, Polymer (2001) 1613-1619.
• [12] Y. Q. Fu, N. K. Bryan, O. N. Shing, N. P. Hung, Influence of redeposition effect for Focused Ion Beam 3D micromachining in silicon, International Journal Advanced Manufacturing Technology 16 (2000) 877-880.
• [13] Leica Image Processing and Analysis System, published by Leica Imaging Systems Ltd, Clifton Road, Cambridge, CB1 3QH England.