Zastosowanie zjawiska modulacji absorpcji na nośnikach swobodnych do nieniszczących badań materiałów półprzewodnikowych

• Autorzy: Chrobak Ł. , Maliński M.

Warianty tytułu

EN

Application of the modulated free carrier absorption phenomenon for nondestructive testing of semiconductor materials

• Języki publikacji: PL

Abstrakty

PL

W pracy przedstawiono rozważania teoretyczne i wyniki eksperymentalne badań parametrów rekombinacyjnych materiałów krzemowych z wykorzystaniem techniki MFCA. Wykorzystana technika badawcza bazuje na zjawisku modulacji absorpcji na nośnikach swobodnych.

EN

This paper presents theoretical and experimental results of investigations of the recombination parameters of the silicon materials with the MFCA method. The applied technique is based on the phenomenon of the modulated free carriers absorption.

Słowa kluczowe

PL

materiały półprzewodnikowe; badania nieniszczące; czas życia nośników

EN

semiconductor materials; nondestructive testing; carriers life time

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Elektronika : konstrukcje, technologie, zastosowania
• Rocznik: 2012
• Tom: Vol. 53, nr 12
• Strony: 110--113
• Opis fizyczny: Bibliogr. 17 poz., il., wykr., rys.

Twórcy

autor

Chrobak Ł.

autor

Maliński M.

• Politechnika Koszalińska, Wydział Elektroniki i Informatyki

Bibliografia

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