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The mechanisms of photocarrier transport through a barrier in the surface space-charge region (SCR) of 2D macroporous silicon structures have been studied at photon energies comparable to that of the silicon indirect band-to-band transition. It was found that the photoconductivity relaxation time was determined by the light modulation of barrier on the macropore surface; as a result, the relaxation itself obeyed the logarithmic law. The temperature dependence of the photoconductivity relaxation time was determined by the thermionic emission mechanism of the current transport in the SCR at temperatures T > 180 K, and by the tunnel current flow at T < 100 K, with temperature-independent tunnelling probability. The photo-emf was found to become saturated or reverse its sign to negative at temperatures below 130 K because of light absorption due to optical transitions via surface electronic states close to the silicon conduction band. In this case, the surface band bending increases due to the growth of a negative charge of the semiconductor surface. The equilibrium electrons in the bulk and photoexcited holes on the macropore surface recombine through the channel of multistage tunnel recombination between the conduction and valence bands.
Słowa kluczowe
Wydawca
Czasopismo
Rocznik
Tom
Strony
394--399
Opis fizyczny
Bibliogr. 21 poz., wykr.
Twórcy
autor
autor
autor
- Lashkaryov Institute of Semiconductor Physics of NAS of Ukraine, 41 Nauki Prosp., 03-028 Kyiv, Ukraine, lakar@isp.kiev.ua
Bibliografia
- [1] V. Lehmann: The physics of macropore formation in low doped n-type silicon. J. Electrochem. Soc. 140, 2836-2843, 1993.
- [2] L. A. Karachevtseva, O. A. Lytvynenko, E. A. Malovichko and E. J. Stronska: Optical transmittance of 2D macroporous silicon structures. Semiconductor Physics, Quantum Electronics & Optoelectronics 4, 347-351, 2001.
- [3] J. D. B. Bradley, P. E. Jessop and A. P. Knights: Silicon waveguide-integrated optical power monitor with enhanced sensitivity at 1550 nm. Appl. Phys. Lett. 86, 241103-1-241103-3, 2005.
- [4] T. Baehr-Jones, M. Hochberg and A. Scherer: Photodetection in silicon beyond the band edge with surface states. Opt. Express 16, 1659-1668, 2008.
- [5] R. Yu. Holiney, L. A. Matveeva, E. F. Venger, L. A. Karachevtseva and O. A. Lytvynenko: Electroreflectance study of macroporous silicon surface. Appl. Surf. Sci. 172, 214-219, 2001.
- [6] V. I. Ivanov, L. A. Karachevtseva, N. I. Karas, O. O. Lytvynenko, K. A. Parshin and A. V. Sachenko: Photoconductivity in macroporous silicon with regular structure of macro-pores. Semiconductor Physics, Quantum Electronics & Optoelectronics 10, 72-76, 2007.
- [7] L. A. Karachevtseva, O. A. Litvinenko, E. A. Malovichko and E. I. Stronskaya: Investigation of electrochemical macro-pore formation in silicon. Theor. Exp. Chem. 36, 193-197, 2000.
- [8] L. A. Karachevtseva, O. A. Lytvynenko, E. A. Malovichko, V. D. Sobolev and O. L. Stronska: Electrical properties of macroporous silicon structures. Semiconductor Physics, Quantum Electronics & Optoelectronics 4, 40-43, 2001.
- [9] K. D. Glinchuk and N. M. Litovchenko: Recombination characteristics of germanium and silicon used in the semiconductor device production. Semiconductor Techniques and Microelectronics 28, 3-22, 1978.
- [10] A. P. Gorban', A. V. Sachenko, V. P. Kostylev, I. O. Sokolovskii and V. V Chernenko: Mechanisms of recombination current formation in forward biased silicon p-n junction and solar cells. Optoelectronics and Semiconductor Technics 39, 57-65, 2004.
- [11] T. Trupke, M. A. Green, P. Würfel, P. P. Altermatt, A. Wang, J. Zhao and R. Corkish: Temperature dependence of the radiative recombination coefficient of intrinsic crystalline silicon. J. Appl. Phys. 94, 4930-4937, 2003.
- [12] A. V. Sachenko and T. V. Panichevskaya: Anomalous surface photo-emf and photovoltage in semiconductors and semiconductor-insulator-semiconductor structures. Preprint Inst. Semicond Phys. Press, Kyiv 9, 10-15, 1989.
- [13] F. Steinrisser and R. E. Henric: Wave length dependence of the surface photovoltage in vacuum cleaved CdS. Surf. Sci. 28, 607-614, 1971.
- [14] A. A. Galaev and A. V. Romanov: Temperature dependence of the work function of an electron and photo-emf of the cleaved surface of the cadmium telluride. Poverkhnost 1, 76-81, 1988.
Typ dokumentu
Bibliografia
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