Test and evaluation of reference-based nonuniformity correction methods for microbolometer infrared detectors

• Autorzy: Orżanowski T. , Madura H.
• Języki publikacji: EN

Abstrakty

EN

In the paper, reference-based nonuniformity correction methods for microbolometer infrared detectors are discussed and tested. In order to evaluate their effectiveness, a complete readout circuit for amorphous silicon microbolometer focal plane array has been designed. The tests were carried out on a developed stand including several extended blackbodies. Some modification of standard two-point correction algorithm incorporating detectors response at external shutter to compensate offset drift is also proposed. The obtained results are presented.

Słowa kluczowe

EN

microbolometer; nonuniformity correction; IR FPA signal processing

• Wydawca: Stowarzyszenie Elektryków Polskich ; Polska Akademia Nauk ; Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego
• Czasopismo: Opto-Electronics Review
• Rocznik: 2010
• Tom: Vol. 18, No. 1
• Strony: 91--94
• Opis fizyczny: Bibliogr. 10 poz., il., wykr.

Twórcy

autor

Orżanowski T.

autor

Madura H.

• Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego Str., 00-908 Warsaw, Poland,

Bibliografia

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