Multi-STFT for adaptive SCPS phase determination

• Autorzy: Sitnik R.
• Języki publikacji: EN

Abstrakty

EN

This paper presents a fast and reliable approach for phase modulo 2π-calculation from a single fringe pattern. It calculates correct phase values even for very complex nd variable shape gradients based on a locally variable fringe period determined for the entire image. In the paper, a new two-step method for wrapped phase calculation is proposed. It is performed through the use of a method based on a multiple local fast Fourier transform for estimation of a local fringes period map and a 5-point spatial carrier phase shifting (SCPS) formula for phase modulo 2π-calculation. The described approach is verified by a correct demodulation of a real fringe pattern taken by a 3D-shape measurement system.

Słowa kluczowe

EN

measurement; phase unwrapping; adaptive SCPS; local fringe period estimation

• Wydawca: Stowarzyszenie Elektryków Polskich ; Polska Akademia Nauk ; Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego
• Czasopismo: Opto-Electronics Review
• Rocznik: 2009
• Tom: Vol. 17, No. 4
• Strony: 325--329
• Opis fizyczny: Bibliogr. 5 poz., wykr., il.

Twórcy

autor

Sitnik R.

• Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Saint A. Boboli Str., 02-525 Warsaw, Poland,

Bibliografia

• [1] Q. Kemao and S. H. Soon: Sequential demodulation of a single fringe pattern guided by local frequencies. Opt. Lett. 22, 127-129, 2007.
• [2] B. T. Kimbrough: Pixelated mask spatial carrier phase shifting interferometry algorithms and associated errors. Appl. Optics 38, 3534-3540, 1999.
• [3] H. Zang, M. J. Lalor, and D. R. Burton: Spatiotemporal phase unwrapping for the measurement of discontinuous objects in dynamic fringe-projection phase-shifting profilometry. Appl. Optics 45, 4554-4562, 2006.
• [4] H. Guo, Q. Yang, and M. Chen: Local frequency estimation for the fringe pattern with a spatial carrier: principle and applications. Appl. Optics 46, 1057-1065, 2007.
• [5] S. Chikkerur, V. Govindaraju, and A. N. Cartwright: Fingerprint image enhancement using STFT analysis. ICAPR, 20-29, 2005.