Influence of quantum dots shape approximation on size reconstructed from atomic force microscopy measurements

• Autorzy: Piotrowski T. , Sikorski S.
• Języki publikacji: EN

Abstrakty

EN

In this work we discuss the influence of the atomic force microscopy (AFM) probe tip geometry and the object - quantum dot form on the quantum dots dimension in the growth plane reconstructed from the AFM measurements. It is shown that ignoring the geometry of the probe tip and the quantum dot leads to significant differences between dimensions obtained from the AFM measurements and the real dimensions. Inaccuracies in QD size determination of the nano-objects from AFM measurements are defined.

Słowa kluczowe

EN

quantum dot; AFM measurements; AFM error; artefact

• Wydawca: Stowarzyszenie Elektryków Polskich ; Polska Akademia Nauk ; Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego
• Czasopismo: Opto-Electronics Review
• Rocznik: 2009
• Tom: Vol. 17, No. 3
• Strony: 252--254
• Opis fizyczny: Bibliogr. 11, wykr.

Twórcy

autor

Piotrowski T.

autor

Sikorski S.

• Institute of Electron Technology, 32/46 Lotników Ave., 02-668 Warsaw, Poland,

Bibliografia

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