TDR-based examination of DSL transmission line

• Autorzy: Opalska K. , Burd A.
• Języki publikacji: EN

Abstrakty

EN

The paper presents results of TDR-based DSL line characterization. Measurement and computer analysis results are included for two distinct modes of TDR system: step and pulse. Measurement results emphasize the influence of a skin effect, which significantly limits measurement system resolution and accuracy. Results of numerous simulations allow for estimation of the dependence of reflected signal parameters on testing pulse width and/or length of line being examined.

Słowa kluczowe

EN

time domain reflectometry; TDR; DSL; transmission line; skin effect; time domain simulation; SPECTRE simulator

PL

reflektometria; dziedzina czasu; reflektometria czasowa; techniki reflektometryczne; linia przesyłowa; zjawisko naskórkowości; symulacja w dziedzinie czasu

• Wydawca: Polish Academy of Sciences, Committee of Electronics and Telecommunication
• Czasopismo: Electronics and Telecommunications Quarterly
• Rocznik: 2008
• Tom: Vol. 54, No 3
• Strony: 357--366
• Opis fizyczny: Bibliogr. 7 poz., wykr.

Twórcy

autor

Opalska K.

autor

Burd A.

• Institute of Electronic Systems, Warsaw University of Technology, Nowowiejska 15/19, 00-665 Warszawa, Poland,

Bibliografia

• 1. I. J. Strickland: Time-domain reflectometry measurements, Textronix Inc. (1970)
• 2. A. Burd, T. Owczarek, K. Opalska: TDR module for DSL line analyzer, Technical report, ISE PW, 2008.
• 3. I. P. De Winter, B. Ashley: AN201 - Step vs Pulse TDR Technology, AEA Technology Inc, www.aeatechnology.com, 2005.
• 4. xDSL Cable Qualifier CableSHARKR P3, operating manual
• 5. TDR Functionality on the ALT 2000, Trend Communications , ALT2000 Application Note No 2.
• 6. S. Misiaszek, A. Burd, K. Opalska, M. Radtke, M. Ramotowski, T. Starecki: Time domain reflectometry educational tool kit for student laboratory, Proc. ICSES, Wrocław, Poland, pp. 195-200 (2002).
• 7. M. Ramotowski, K. Opalska: Evaluation of skin-effect distortions in delay lines with PSPI-CE models, Proc. of SPIE, 6159, pp. 61592W-1 - 61592W-4 (2005).