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Comparison of Detailed Descriptors for Noisy Silhouettes

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Wybrane pełne teksty z tego czasopisma
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Języki publikacji
EN
Abstrakty
EN
In this paper we propose a new method for comparing silhouettes. Silhouettes of 3D objects, extracted from 2D images, are described using the LWDOS language [21]. Sometimes, even though the silhouettes appear identical, their LWDOS detailed descriptors may be very different; therefore, we might wrongly conclude that the two silhouettes are different. In order to eliminate this problem which is due to several phenomena, we try to deduce the same detailed descriptor from two slightly different descriptors of two silhouettes.
Słowa kluczowe
Rocznik
Strony
83--104
Opis fizyczny
Bibliogr. 25 poz., il., wykr.
Twórcy
autor
autor
  • LRIA Laboratory, Computer Science Department, USTHB University, Algiers, Algeria
Bibliografia
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  • [20] Chetverikov D.: A Simple and Efficient Algorithm for Detection of High Curvature Points in Planar Curves. 10th Int. Conference, Groningen, the Netherlands, 2003.
  • [21] Larabi S., Bouagar B., Trespaderne F., Lopez E.: LWDOS language for writing descriptors of outline shapes. In the 13th Scandinavian Conference on Image Analysis, Goteburg Sweden, 2003.
  • [22] Sebastian T., Klein P., Kimia B.: Recognition of Shapes by Editing Their Shock Graphs. IEEE Transactions on Pattern Analysis and Machine Intelligence, 26(5): 550-571, 2004.
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  • [25] Aouat S., Larabi S.: Comparison of silhouettes descriptions. Int. Conference on Graphic vision and image processing, Cairo, Egypt, 2005.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BWAD-0015-0004
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