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Linear and nonlinear optical properties of Zn 1-xMgxSe layers grown by MBE and PLD methods

Wybrane pełne teksty z tego czasopisma
Identyfikatory
Warianty tytułu
Konferencja
International Conference on Solid State Crystals : Material Science and Applications (4ICSSC) and Polish Conference on Crystal Growth (7PCCG) ; (16-20.05.2004 ; Zakopane-Kościelisko, Poland)
Języki publikacji
EN
Abstrakty
EN
Ternary and quaternary AII BVI mixing semiconductors are very attractive materials for various optical devices. Their optical properties such as the energy gap, linear refractive index, absorption coefficient and lattice constant can be changed with increasing component. For the practical application linear and nonlinear optical characterizations such as the two-photon absorption (TPA), linear and nonlinear refractive indexes are an important aspect. A practical motivation to measure the magnitude of TPA coefficient is that the performance of a device based on nonlinear refraction is strongly affected by the eventual nonlinear absorption. The refractive index and TPA coefficient of Zn1-xMgxSe compounds grown on glass substrates by molecular beam epitaxy (MBE) and pulsed laser deposition (PLD) methods were systematically investigated as a function of Mg composition. The linear optical properties have been studied using transmission, reflection, and photoreflection spectroscopy. The nonlinear optical properties of these materials were investigated by the nonlinear transmission. The energy gap and linear refractive index of these materials change with Mg content, hence the nonlinear optical processes such as TPA and nonlinear refraction index can be modified.
Twórcy
autor
  • Institute of Physics, Nicholas Copernicus University, 5/7 Grudziądzka, 87-100 Toruń, Poland
autor
  • Institute of Physics, Nicholas Copernicus University, 5/7 Grudziądzka, 87-100 Toruń, Poland
  • Institute of Physics, Nicholas Copernicus University, 5/7 Grudziądzka, 87-100 Toruń, Poland
autor
  • Laboratoire des Propriétés Optiques des Matériaux et Applications (POMA), EP CNRS 130, Université d’Angers, 2 Boulevard Lavoisier, 49045, Angers Cedex 01, France
autor
  • Institute of Physics, Nicholas Copernicus University, 5/7 Grudziądzka, 87-100 Toruń, Poland
Bibliografia
  • 1. H.J. Chen, D.Y. Lin, Y.S. Huang, R.C. Tu, Y.K. Su, and K.K. Tiong, “Temperature dependence of the band-edge exciton of a Zn0.88Mg0.12S0.18Se0.82 epilayer on GaAs”, Semicond. Sci. Technol. 14, 85-88 (1999).
  • 2. T. Morita, H. Shinbo, T. Nagano, I. Nomura, A. Kikuchi, and K. Kishino, “Refractive index measurements of MgZnCdSe II.VI compound semiconductors grown on InP substrates and fabrications of 500-600 nm range MgZnCdSe distributed Bragg reflectors”, J. Appl. Phys. 81, 7575-7579 (1997).
  • 3. J. Ma, S.M. Wang, D.Z. Shen, X.W. Fan, and J.Q. Yu, “The study of third order nonlinearities in ZnCdSe-ZnSe/GaAs MQWs using Z-scan”, Solid State Commun. 97, 961-963 (1996).
  • 4. D.A. Minkov, “Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum”, J. Phys. D: Appl. Phys. 22, 1157-1161 (1989).
  • 5. M. Luttmann, F. Bertin, and A. Chabli, “Optical properties of Cd1.xMgxTe epitaxial layers: A variable-angle spectroscopic ellipsometry study”, J. Appl. Phys. 78, 3387-3391 (1995).
  • 6. R. Andre and Le Si Dang, “Low - temperature refractive indices of Cd1-xMnxTe and Cd1-yMgyTe”, J. Appl. Phys. 82, 5086-5089 (1997).
  • 7. J.I. Pankove, Optical Processes in Semiconductors, Dover Publications, Inc., New York, 1971.
  • 8. B. Derkowska, B. Sahraoui, X. Nguyen Phu, G. Glowacki, and W. Bala, “Study of linear optical properties and two photon absorption in Zn1-xMgxSe tin layers”, Optical Materials 15, 199-203 (2000).
  • 9. M.E. Constantino, H. Navarro-Contreras, M.A. Vidal, B. Salazar-Hernandez, A. Lastras-Martinez, I. Hernandez-Calderon, and M. Lopez-Lopez, “Strain in GaAs at the heterointerface of ZnSe/GaAs/GaAs”, J. Phys. D: Appl. Phys. 32, 1293-1301 (1999).
  • 10. J. Misiewicz, P. Sitarek, and G. Sęk, Introduction to the Photoreflectance Spectroscopy of Semiconductor Structures, OWPW, Wrocław, 1999.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BWA2-0010-0026
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