A new Method of Calibration of Lateral Force in Atomic Force Microscope (AFM)

• Autorzy: Ekwińska M.
• Konferencja: International Conference on Modelling in Mechatronics (9 ; 02-04.09.2004 ; Kazimierz Dolny, Poland)
• Języki publikacji: EN

Abstrakty

EN

This paper deals with a new calibration technique of lateral force in AFM. The methods is based on the application of the defined lateral force on the tip of the cantilever. The deflection of the cantilever is then measured and is used to estimate of the lateral force during scanning process.

Słowa kluczowe

EN

atomic force microscope; lateral force calibration

• Wydawca: Oficyna Wydawnicza Politechniki Warszawskiej
• Czasopismo: Machine Dynamics Problems
• Rocznik: 2004
• Tom: Vol. 28, No. 3
• Strony: 89--94
• Opis fizyczny: Bibliogr. 5 poz.

Twórcy

autor

Ekwińska M.

• Warsaw University of Technology, Institute of Micromechanics and Photonics,

Bibliografia

• [1] Bushan, B., Fuchs, H., Hosaka, S. (eds), 2004, Applied Scanning Probe Methods, Berlin, Springer.
• [2] Cain, R.G., Biggs, S., Page, N.W., 2000, Force calibration in lateral force microscopy, Journal of Colloid Interface Sci., 227, 55-65.
• [3] Liu, E, Blanpain, B., Celis, J.P., 1996, Calibration procedures for frictional measurements with lateral force microscopy, Wear, 192, 141-150.
• [4] Ruan, J., Bushan, B., 1994, Atomic-scale friction measurements using friction force microscopy: part I -general principles and new measurements techniques, ASME, J. Tribol., 116, 378-388.
• [5] Varenberg, M., Etison, I, Halperin, G., 2003, An improved wedge calibration method for lateral force in atomie force microscopy, Reviev Scientific Instruments, 74, 3362-3367.