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Colour image segmentation algorithm in vectoral approach for automated optical inspection in electronics

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Konferencja
The Fourth Scientific Symposium on Image Processing Technology. TPO 2002 ; (21.11-23.11.2002 ; Serock, Poland)
Języki publikacji
EN
Abstrakty
EN
This paper presents the robust colour image segmentation algorithm which can be used extensively in automated optical inspection system on the printed circuits boards (PCB) assembly line. The robustness of the presented algorithm is increased by low computational effort what dedicates this approach to on-line vision systems explored in high-speed production lines. The second advantage of the proposed algorithm is the non-parametric solution which is invariant to changes of light and colour of the inspected components. This condition should be fulfilled with the vectoral imaging approach where the most important task is the segmentation process which divides image space into disjoint regions with similar colour or texture.
Twórcy
autor
  • Systems and Computer Networks, Faculty of Electronics, Technical University of Wrocław, 27 Wybrzeże Wyspiańskiego Str., 50-370 Wrocław, Poland
Bibliografia
  • 1. N.R. Pal and S.K. Pal, "A review on image segmentation techniques", Pattern Recognition 29, 1277-1294 (1993).
  • 2. K.S. Fu and J.K. Mui, "A survey on image segmentation", Pattern Recognition 13, 3-16 (1981).
  • 3. W. Tarnawski, "Fast and efficient colour image segmentation based on clustering modified HSI colour space", Proc. 4th Sci. Symp. on Images Processing Techniques, Warsaw University of Technology, Serock, 244-257 (2002). (in Polish).
  • 4. Ch.D. Cheng, X.H. Jiang, and J. Wang, "Colour image segmentation based on homogram thresholding and region merging", Pattern. Recognition. 35, 373-393 (2002).
  • 5. S.K. Pal and D.K. Dutta Majumder, Fuzzy Mathematical Approach to Pattern. Re cognition, Wiley &Sons, New York, 1986.
  • 6. W. Tarnawski and A. Merta, "Colour image segmentation based on fuzzy rule derived from entropy measurement", Machine Graphics & Vision 9, 487-495 (2000).
  • 7. K. Fukunaga, Introduction to Statistical Pattern Recognition, Academic Press, New York, 1990.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BWA2-0007-0038
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