Interfaces as design tools for short-period InAs/GaSb type-II superlattices for mid-infrared detectors

• Autorzy: Szmulowicz F. , Haugan H. J. , Brown G. J. , Mahalingam K. , Ullrich B. , Munshi S. R. , Grazulis L.
• Konferencja: Infrared Photodetectors (IPH) ; (30-31.08.2005, Warsaw, Poland)
• Języki publikacji: EN

Abstrakty

EN

The effect of interface anisotropy on the electronic structure of InAs/GaSb type-II superlattices is exploited in the design of thin-layer superlattices for mid-IR detection threshold. The design is based on a theoretical envelope function model that incorporates the change of anion and cation species across InAs/GaSb interfaces, in particular, across the preferred InSb interface. The model predicts that a given threshold can be reached for a range of superlattice periods with InAs and GaSb layers as thin as a few monolayers. Although the oscillator strengths are predicted to be larger for thinner period superlattices, the absorption coefficients are comparable because of the compensating effect of larger band widths. However, larger intervalence band separations for thinner-period samples should lead to longer minority electron Auger lifetimes and higher operating temperatures in p-type SLs. In addition, the hole masses for thinner-period samples are on the order the free-electron mass rather than being effectively infinite for the wider period samples. Therefore, holes should also contribute to photoresponse. A number of superlattices with periods ranging from 50.6 to 21.2 Å for the 4 µm detection threshold were grown by molecular beam epitaxy based on the model design. Low temperature photoluminescence and photoresponse spectra confirmed that the superlattice band gaps remained constant at 330 meV although the period changed by the factor of 2.5. Overall, the present study points to the importance of interfaces as a tool in the design and growth of thin superlattices for mid-IR detectors for room temperature operation.

Słowa kluczowe

EN

superlattice; infrared detector; InAs/GaSb; interface; envelope function

• Wydawca: Stowarzyszenie Elektryków Polskich ; Polska Akademia Nauk ; Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego
• Czasopismo: Opto-Electronics Review
• Rocznik: 2006
• Tom: Vol. 14, No. 1
• Strony: 71--77
• Opis fizyczny: Bibliogr. 36 poz., wykr.

Twórcy

autor

Szmulowicz F.

autor

Haugan H. J.

autor

Brown G. J.

autor

Mahalingam K.

autor

Ullrich B.

autor

Munshi S. R.

autor

Grazulis L.

• Air Force Research Laboratory, Materials & Manufacturing Directorate, Wright-Patterson AFB, OH, 45433-7707 USA,

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