Noise minimization via deep submicron system-on-chip integration in megapixel CMOS imaging sensors

• Autorzy: Kozlowski L. J.
• Konferencja: Infrared Photodetectors (IPH) ; (30-31.08.2005, Warsaw, Poland)
• Języki publikacji: EN

Abstrakty

EN

Infrared sensor designers have long maximized S/N ratio by employing pixel-based amplification in conjunction with supplemental noise suppression. Instead, we suppress photodiode noise using novel SoC implementation with simple three transistor pixel; supporting SoC components include a feedback amplifier having elements distributed amongst the pixel and column buffer, a tapered reset clock waveform, and reset timing generator. The tapered reset method does not swell pixel area, compel processing of the correlated reset and signal values, or require additional memory. Integrated in a 2.1 M pixel imager developed for generating high definition television, random noise is ~8e- at video rates to 225 MHz. Random noise of ~30e would otherwise be predicted for the 5 µm by 5 µm pixels having 5.5 fF detector capacitance with negligible image lag. Minimum sensor S/N ratio is 52 dB with 1920 by 1080 progressive readout at 60 Hz, 72 Hz and 90 Hz. Fixed pattern noise is <2 DN via on-chip signal processing.

Słowa kluczowe

EN

CMOS image sensor; active pixel sensor; HDTV; FPA; CCD; APS

• Wydawca: Stowarzyszenie Elektryków Polskich ; Polska Akademia Nauk ; Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego
• Czasopismo: Opto-Electronics Review
• Rocznik: 2006
• Tom: Vol. 14, No. 1
• Strony: 11--18
• Opis fizyczny: Bibliogr. 15 poz., wykr.

Twórcy

autor

Kozlowski L. J.

• AltaSens, 501 Martin St., Suite #200, Thousand Oaks, CA 91360, USA,

Bibliografia

• 1. K. Vural, L.J. Kozlowski, and R.W. Rasche, "256x256 HgCdTe focal plane array for the Hubble space telescope",Proc. SPIE 1320, 107-108 (1990).
• 2. L.J. Kozlowski, "Attributes and drawbacks of submicron CMOS for IR FPA readouts", SPIE 3360, 91-100 (1998).
• 3. B. Fowler, M.D. Godfrey, and S. Mims, "Analysis of reset noise suppression via stochastic differential equations", Proc. 2005 IEEE Workshop on CCD and AIS, 19-22 (2005).
• 4. L. Kozlowski, G. Rossi, L. Blanquart, R. Marchesini, Y. Huang, G. Chow, J. Richardson, and D. Standley, "Pixel noise suppression via SoC management of tapered reset in a 1920x1080 CMOS image sensor", JSSC.
• 5. P. Noble, "Light sensitive arrays based on photodiodes combined with M.O.S. devices," presented at the IEE Conf. on Integrated Circuits, Eastbourne, England, May 1967; also IEE Conf. Publ. 30, 251.
• 6. L.J. Kozlowski, S.A. Cabelli, D.E. Cooper, and K. Vural, "Low background infrared hybrid focal plane array characterization", Proc. SPIE 1946, 199-213 (1993).
• 7. B. Fowler, M. Godfrey, J. Balicki, and J. Canfield, "Low-noise readout using active reset for CMOS APS", Proc. SPIE 3965, 126-135 (2000).
• 8. U.S. Patent 6,493,030 issued Dec. 10, 2002.
• 9. B. Fowler, M.D. Godfrey, and S. Mims, "Analysis of reset noise suppression via stochastic differential equations", Proc. 2005 IEEE Workshop on CCD and AIS, 19-22 (2005).
• 10. K. Mitani, M. Sugawara, and F. Okano, "Experimental ultrahigh-definition colour camera system with three 8M pixel CCDs", SMPTE Journal 111, April 2002.
• 11. S. Ohsawa, and Y. Matsunaga, "Analysis of low signal level characteristics for high-sensitivity CCD charge detector", IEEE Trans. Electron Devices 39, 1465-1468 (1992).
• 12. J. Hynecek, "CCM-a new low-noise charge carrier multiplier suitable for detection of charge in small pixel CCD image sensors", IEEE Trans. Electron Devices 39, 1972-1975 (1992).
• 13. L.J. Kozlowski, K. Vural, J. Luo, A. Tomasini, T. Liu and W.E. Kleinhans, "Low noise infrared and visible focal plane arrays", Opto-Electron. Rev. 7, 259-269 (1999)
• 14. "Kodak CMOS image sensors ISO measurement", Application Note MTD/PS-0234, July 24, 2001.
• 15. R. Baer and J. Holm, "A model for calculating the potential ISO speeds of digital still cameras based upon CCD characteristics", Proc. IS&T PICS Conference, 35-38 (1999).