Advanced system for calibration and characterization of solar cells

• Autorzy: Granek F. , Żdanowicz T.
• Konferencja: XVII School of Optoelectronics : Photovoltaics-Solar Cells and Detector ; (17. ; 13.10-17.10.2003 , Kazimierz Dolny, Poland)
• Języki publikacji: EN

Abstrakty

EN

This paper presents high performance setup developed at the SolarLab to measure current-voltage (I–V) curves of solar cells. The core of a setup is a steady light solar simulator of class A, according to specifications of IEC 60904-9 and ASTM E927 standards. Available range of measurements enables us to characterise not only all kinds of silicon wafer-based solar cells but also thin film cells and minimodules. A lot of effort has been done to make a setup as a powerful tool for advanced research work. For that purpose, such options have been implemented as various algorithms for I–V curve translation to external conditions other than those recorded during measurement or several techniques to determine lumped series resistance of solar cells (in both cases procedures recommended by IEC 60891 standard have been included). Advanced numerical fitting algorithms allow to extract from I–V curves the parameters corresponding to either of three commonly used equivalent diode models of a solar cell. Using an independent microprocessor unit, the temperature of the measuring table may be controlled in the range 0–60 °C due to a system of four Peltier cells attached to its rear side. This allows for routine determination of thermal coefficients of basic cell parameters. The paper discusses also some of elemental random and nonrandom error sources that can be encountered during the standard I–V measurements of a solar cell. The test results of repeatability of measurements, problems related to probe configuration, and heating up of the cells during “light” measurements are presented showing that the developed system can be successfully used both for laboratory work and as a tester on a production line. The system meets all requirements of the IEC 60904-1, IEC 60904-3, and IEC 60904-9 standards.

Słowa kluczowe

EN

I-V curve; solar cell calibration; solar cell characterisation

• Wydawca: Stowarzyszenie Elektryków Polskich ; Polska Akademia Nauk ; Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego
• Czasopismo: Opto-Electronics Review
• Rocznik: 2004
• Tom: Vol. 12, No. 1
• Strony: 57--67
• Opis fizyczny: Bibliogr. 13 poz.

Twórcy

autor

Granek F.

• Faculty of Microelectronic Systems and Photonics, SolarLab, Wrocław University of Technology, 11/17 Janiszewskiego Str., 50-372 Wrocław, Poland

autor

Żdanowicz T.

• Faculty of Microelectronic Systems and Photonics, SolarLab, Wrocław University of Technology, 11/17 Janiszewskiego Str., 50-372 Wrocław, Poland

Bibliografia

• 1. IEC 60904-1, Photovoltaic devices – Part 1: Measurement of PV current-voltage characteristics.
• 2. IEC 60904-3, Photovoltaic devices – Part 3: Measurement principles for terrestrial photovoltaic (PV) solar devices with reference spectral irradiance data.
• 3. IEC 60904-9, Photovoltaic devices – Part 9: Solar simulator performance requirements.
• 4. IEC 60904-5, Photovoltaic devices – Part 5: Determination of the equivalent cell temperature (ECT) of photovoltaic devices by the open-circuit method.
• 5. A.G. Aberle, S.R. Wenham, and M.A. Green, “A new method for accurate measurements of the lumped series resistance of solar cells”, Proc. 23rd IEEE PV Solar Energy Conf., 133–139 (1993).
• 6. IEC 60891, Procedures for temperature and irradiance corrections to measured I–V characteristics of crystalline silicon photovoltaic devices.
• 7. G. Blaesser and E. Rossi, “Extrapolation of outdoor measurements of PV array I–V characteristics to standard test conditions”, Solar Cells 25, 91–96 (1988).
• 8. A.J. Anderson, “Photovoltaic translation equations. A new approach”, Subcontract No. TAD-4-14166-01, Final Subcontract Report No. NREL/TP-411-20279, NREL, Jan. 1996.
• 9. S. Coors and M. Boehm, “Validation and comparison of curve correction procedures for silicon solar cells”, Proc. 12th EC PV Solar Energy Conf., Amsterdam, 1311–1314 (1994).
• 10. T. Zdanowicz, “Interactive computer program to fit I–V curves of solar cells”, Proc. 12th EC PV Solar Energy Conf., Amsterdam, 131–1314 (1994).
• 11. J. Beier and B. Voss, “Humps in dark I–V curves – analysis and explanation”, Proc. 23rd IEEE PV Solar Energy Conf., 321–325 (1993).
• 12. M. Pellegrino, G. Flamini, A. Sarno, and J. Zhao, “Dark measurements technique for PV modules quality evaluation”, Proc. 17th EC PV Solar Energy Conf., 732–735 (2001).
• 13. “Market survey on cell testers and sorters”, PHOTON International. The Photovoltaic Magazine 10, 48–57 (2002).