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Abstrakty
The paper presents a differential interferometry phenonenon in a planar optical structure, which uses a ferronematic layer of a liquid crystal. This layer changes propagation conditions for TM modes in external magnetic field. Due to the magnetic field action on a ferronematic layer whichcovers the planar waveguide coated with an additional orientative layer, the ellipsoid of the refractive index changes its orientation in a polarization plane of the TM mode. In consequence, the phase difference of the TM mode occurs under magnetic field influence. This paper provides an analysis of the influence of a thickness and a refractive index of the orientative layer on interference phenomenon in analyzed structure.
Czasopismo
Rocznik
Tom
Strony
507--514
Opis fizyczny
Bibliogr. 6 poz., rys.
Twórcy
autor
- Optoelectronic Department of Institute of Physics, Silesian University of Technology, ul. Bolesława Krzywoustego 2, 44-100 Gliwice, Poland
autor
- Optoelectronic Department of Institute of Physics, Silesian University of Technology, ul. Bolesława Krzywoustego 2, 44-100 Gliwice, Poland
Bibliografia
- [1] BROCHARD F., DE GENNES P.G., J. Phys. 31 (1970), 691.
- [2] BURYLOV S.V., RAIKHER YU.L., Mol. Cryst. Liq. Cryst. 258 (1995), 107.
- [3] CHEN S.-H., AMER N.M., Phys. Rev. Lett. 51 (1983), 2298.
- [4] GUT K., BŁAHUT M., ROGOZIŃSKI R., OPILSKI Z., OPILSKI A., Proc. SPIE 3058 (1997), 137.
- [5] LUKOSZ W., Sens. Actuators B 29 (1995), 37.
- [6] BURYLOV S.V., RAIKHER YU.L., Mol. Cryst. Liq. Cryst. 258 (1995), 123.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BWA1-0004-0020