Investigations of electronic structure of topological defects in carbon nanotubes by scanning tunneling microscopy and current imaging tunneling spectroscopy

• Autorzy: Klusek Z. , Byszewski P. , Kowalczyk P.
• Konferencja: Surface and Thin Film Structures' 1999 (7 ; 15-18.09.1999 ; Kazimierz Dolny, Poland)
• Języki publikacji: EN

Abstrakty

EN

Scanning tunneling microscopy and current imaging tunneling spectroscopy are used to study electronic structure of the five and seven membered fused disclination centers located at the end of the carbon nanotube. Our results show two resonant states at 1.2 eV below and 1.3 eV above the Fermi level. Furthermore the presence of the metallic-semiconductor transition at the end of the carbon nanotube is confirmed.

• Wydawca: Institute of Electron Technology
• Czasopismo: Electron Technology
• Rocznik: 2000
• Tom: Vol. 33, No. 3
• Strony: 355--360
• Opis fizyczny: Bibliogr. 15 poz.

Twórcy

autor

Klusek Z.

autor

Byszewski P.

autor

Kowalczyk P.

• Department of Solid State Physics, University of Łódź, ul. Pomorska 149/153, 90-236 Łódź, Poland