Modular scanning system

• Autorzy: Klusek Z. , Olejniczak W. , Pawłowski S. , Kobierski P.
• Konferencja: Seminar on Surface and Thin Film Structures (5 ; 23-26.09.1997 ; Ustroń, Poland)
• Języki publikacji: EN

Abstrakty

EN

A new, fully computerized scanning tunneling and atomic force microscope system has been designed and built. Both microscope are equipped with fully automatic system of initial approach of the probe tip to the sample. Special construction of the holders ensures an easy replacement of samples and probe tips. The system allows the operation in a wide range of scanning, starting from nanometers to microus using one scanner only (retaining the hight resolution). All functions of the microscopes are fully controlled by personal computer. Due to orginal, clear software written under Windows 3.1/Windows 95 systems on can execute each operation only with a mouse.

• Wydawca: Institute of Electron Technology
• Czasopismo: Electron Technology
• Rocznik: 1998
• Tom: Vol. 31, No. 3/4
• Strony: 508--511
• Opis fizyczny: Bibliogr. 5 poz.

Twórcy

autor

Klusek Z.

autor

Olejniczak W.

autor

Pawłowski S.

autor

Kobierski P.

• Departament of Solid State Physics, University of Łódź, ul. Pomorska 149/153, 90-236 Łódź, Poland,