Application of principial component and factor analyses in electron spectroscopy

• Autorzy: Siuda R. , Balcerowska G.
• Konferencja: Seminar on Surface and Thin Film Structures (5 ; 23-26.09.1997 ; Ustroń, Poland)
• Języki publikacji: EN

Abstrakty

EN

Fundamentials of two methods, taken from multivariate analysis and known as principial component analysis (PCA) and factor analysis (FA), are presented. Both methods are well known in chemometrics. Since 1979, when application of the methods to electron spectroscopy was reported for the first time, they became to be more and more popular in different branches of electron spectroscopy. The paper presents exsamples of standard applications of the methods in Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and electron energy loss spectroscopy (EELS). Advantages one can take from application of the methods, their potentialities as well as thier limitationa are pointed out.

• Wydawca: Institute of Electron Technology
• Czasopismo: Electron Technology
• Rocznik: 1998
• Tom: Vol. 31, No. 3/4
• Strony: 487--494
• Opis fizyczny: Bibliogr. 73 poz.

Twórcy

autor

Siuda R.

autor

Balcerowska G.

• Institute of Mathematics and Physics, University of Technology and Agriculture, ul. Kaliskiego 7, 85-796 Bydgoszcz, Poland