The infuence of scattering effect on generated radiation of microchips

• Autorzy: Ciosek J.
• Konferencja: Seminar on Surface and Thin Film Structures (5 ; 23-26.09.1997 ; Ustroń, Poland)
• Języki publikacji: EN

Abstrakty

EN

Questions of scattring effect by rough surfaces stay a foreground problems on optics in view of thier prevelance. The problem of definition of critical or satisfactory state of optical surface is siginificant especially for active optical elements, generating coherent radiation. This problem occurs extreme with used microlasers with the thickness of decimal parts of millimetre. An Nd: fluorophosphate glass (LG800) have been used as active laser media. Presented results enable the qualification of critical surface condition of microlaser.

• Wydawca: Institute of Electron Technology
• Czasopismo: Electron Technology
• Rocznik: 1998
• Tom: Vol. 31, No. 3/4
• Strony: 431--434
• Opis fizyczny: Bibliogr. 28 poz.

Twórcy

autor

Ciosek J.

• Institute of Optoelectronics, Military University of Technology, ul. Kaliskiego 2, 01-498 Warszawa 49, Poland