Optical reflectivity of ultrathin Pb layers and the quantum size effect

• Autorzy: Jałochowski M. , Stróżak M. , Zdyb R.
• Konferencja: Seminar on Surface and Thin Film Structures (5 ; 23-26.09.1997 ; Ustroń, Poland)
• Języki publikacji: EN

Abstrakty

EN

We have studied in situ the reflectance difference (RD) during depositon of ultrathin Pb epitaxial film onto Si(111)-(6x6)Au substrates held at 100 K in UHV conditions. S- and p-polarized radiation with energy within the range from 0.5 eV to 3.0 eV was used to excite electron transitions in the Pb samples showing the quantum size effects (QSE). The optical reflection data were analysed using classical and QSE theories. Observed thicknees-dependet reflectivity variations were correlated with previously measurmed electrical resistivity oscillations. Scattering time of electrons involved in the electrical resistivity measurements. Evidences of optical diamagnetic and paramagnetic response of electrons in the metallic quantum well are prasented and discussed.

• Wydawca: Institute of Electron Technology
• Czasopismo: Electron Technology
• Rocznik: 1998
• Tom: Vol. 31, No. 3/4
• Strony: 291--300
• Opis fizyczny: Bibliogr. 17 poz.

Twórcy

autor

Jałochowski M.

autor

Stróżak M.

autor

Zdyb R.

• Institute of Physics, Maria Curie-Skłodowska University, 20-031 Lublin, Pl. Marii Curie-Skłodowskiej 1, Poland