Investigations of laser deposited semiconductor layers with the STM

• Autorzy: Piotrowski T. , Pułtorak J. , Kulumbetov Z. E. , Liptuga A. I. , Plyatsko S. V.
• Konferencja: Polish-Japanese Joint Seminar on Materials Analysis (1-3.09.1997 ; Warsaw, Poland)
• Języki publikacji: EN

Abstrakty

EN

In the work results of topographic measurements with the STM (scanning tunneling microscope) for the determination of the surface roughness and grain dimensions of PbTe/BaF₂ layers grown by the source evaporation technique have been presented. The measuremants have been carried out for various substrate temperatures (100 ÷ 400°C) and various power densities of the laser beam. A modulated infrared laser with hv

• Wydawca: Institute of Electron Technology
• Czasopismo: Electron Technology
• Rocznik: 1998
• Tom: Vol. 31, No. 2
• Strony: 219--223
• Opis fizyczny: Bibliogr. 6 poz.

Twórcy

autor

Piotrowski T.

autor

Pułtorak J.

autor

Kulumbetov Z. E.

autor

Liptuga A. I.

autor

Plyatsko S. V.

• Institute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland