Parsing of random graph languages for automated inspection in statisfical-based quality assurance systems

• Autorzy: Flasiński M. , Skomorowski M.
• Języki publikacji: EN

Abstrakty

EN

Basic requirements for an automated visual inspection in intelligent SPC-oriented quality assurance systems are discussed. Extensions of feature IE-graphs representing solids in CAD ([62]) to a stochastic model of manufacturing processes are proposed. An efficient random graph language analysis based on parsable ETPL(k) graph grammars([55)] is presented as a tool for intelligent reasoning in high layer modules of automated inspection systems. The first applications of the model are shown.

Słowa kluczowe

EN

graph parsing; graph grammar; syntactic pattern recognition; visual inspection

• Wydawca: Institute of Information Technology of the Warsaw University of Life Sciences – SGGW
• Czasopismo: Machine Graphics and Vision
• Rocznik: 1998
• Tom: Vol. 7, No. 3
• Strony: 565--623
• Opis fizyczny: Bibliogr. 77 poz.

Twórcy

autor

Flasiński M.

autor

Skomorowski M.

• Institute of Computer Science, Jagiellonian University, Cracow, Poland