Remarks on Statistical Design Centering

• Autorzy: Opalski L. J.
• Języki publikacji: EN

Abstrakty

EN

The paper overviews optimization based statistical design centering techniques for analog circuits. Emphasis is placed on dependence between formulation of quality indices, problem formulation, and computational complexity of design centering algorithms, executed in single- or multiple-processor environments. For characterization of solution techniques a standard CMOS op-amp design case and a simplified computational complexity analysis are used.

Słowa kluczowe

EN

statistical design centering; design yield; realistic worst-case design; stochastic approximation; propagation of variance; Monte Carlo simulation

• Wydawca: Polish Academy of Sciences, Committee of Electronics and Telecommunication
• Czasopismo: International Journal of Electronics and Telecommunications
• Rocznik: 2011
• Tom: Vol. 57, No. 2
• Strony: 159--167
• Opis fizyczny: Bibliogr. 30 poz., wykr.

Twórcy

autor

Opalski L. J.

• Institute of Electronic Systems, Warsaw University of Technology, Nowowiejska 15/19, 00-665 Warsaw, Poland,

Bibliografia

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