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Nanopatterning in a compact setup using table top extreme ultraviolet lasers

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Języki publikacji
EN
Abstrakty
EN
The recent development of table top extreme ultraviolet (EUV) lasers have enabled new applications that so far were restricted to the use of large facilities. These compact sources bring now to the laboratory environment the capabilities that will allow a broader application of techniques related to nanotechnology and nanofabrication. In this paper we review the advances in the utilization of EUV lasers in nanopatterning. In particular we show results of the nanopatterning using a table-top capillary discharge laser producing 0.12-mJ laser pulses with 1.2-ns time duration at a wavelength λ = 46.9 nm. The nanopatterning was realized by interferometric lithography using a Lloyd's mirror interferometer. Two standard photoresists were used in this work, polymethyl methacrylate (PMMA) and hydrogen silsesquioxane (HSQ). Pillars with a full width half maximum (FWHM) diameter of 60 nm and holes with FWHM diameter of 130 nm were obtained over areas in excess of 500x500 µm².
Twórcy
autor
autor
  • NSF ERC for Extreme Ultraviolet Science & Technology and Department of Electrical and Computer Engineering, Colorado State University, Colorado, USA, wachulak@engr.colostate.edu
Bibliografia
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  • 7. H.H. Solak, D. He, W. Li, S. Singh-Gasson, F. Cerrina, B.H. Sohn, X.M. Yang, and P. Nealey, “Exposure of 38 nm period grating patterns with extreme ultraviolet interferometric lithography”, Appl. Phys. Lett. 75, 2328-2330 (1999).
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  • 18. B.R. Benware, C.H. Moreno, D.J. Burd, and J.J. Rocca, “Operation and output pulse characteristics of an extremely compact capillary-discharge tabletop soft-x-ray laser”, Opt. Lett. 22, 796-798 (1997).
  • 19. C.D. Macchietto, B.R. Benware, and J.J. Rocca, “Generation of millijoule-level soft-x-ray laser pulses at a 4-Hz repetition rate in a highly saturated tabletop capillary discharge amplifier”, Opt. Lett. 24, 1115-1117 (1999).
  • 20. Y. Liu, M. Seminario, F.G. Tomasel, C. Chang, J.J. Rocca, and D.T. Attwood, “Achievement of essentially full spatial coherence in a high-average-power soft-x-ray laser”, Phys. Rev. A6303, (2001).
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  • 22. I. Junarsa, M.P. Stoykovich, P.F. Nealey, Y.S. Ma, and F. Cerrina, “Hydrogen silsesquioxane as a high resolution negative-tone resist for extreme ultraviolet lithography”, J. Vac. Sci. Technol. B23, 138-143 (2005).
  • 23. P.W. Wachulak, M.G. Capeluto, M.C. Marconi, C.S. Menoni, and J.J. Rocca, “Patterning of nano-scale arrays by table-top extreme ultraviolet laser interferometric lithography”, Opt. Express 15, 3465-3469 (2007).
  • 24. I.B. Baek, J.H. Yang, W.J. Cho, C.G. Ahn, K. Im, and S. Lee, “Electron beam lithography patterning of sub-10 nm line using hydrogen silsesquioxane for nanoscale device applications”, J. Vac. Sci. Technol. B23, 3120-3123 (2005).
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Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BWA0-0036-0015
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