Thermally induced changes of broad contact pulse-operated single quantum well (SQW) separate confinement heterostructure (SCH) laser spectra

• Autorzy: Kowalczyk E. , Ornoch L. , Szerling A. , Mroziewicz B.
• Konferencja: Surface Physics and Thin-Films Structure Seminar ; 17-21.05.2005 ; Szklarska Poręba, Poland
• Języki publikacji: EN

Abstrakty

EN

A technique of time-resolved laser spectra mapping has been developed to assess thermo-optical properties of diode lasers. Using this technique the emission spectra of broad contact pulse operated diode lasers were measured for consecutive time points within the pulse duration width. The emitted wavelength was found to be highly dependent on the time elapsing from the pulse front and a time shift of wavelength was clearly observed in the spectrum of pulse-operated lasers.

Słowa kluczowe

EN

thermal dynamics; SQW; laser; spectrum

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2005
• Tom: Vol. 35, nr 3
• Strony: 573--578
• Opis fizyczny: Bibliogr. 5 poz., il., wykr.

Twórcy

autor

Kowalczyk E.

• Institute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland

autor

Ornoch L.

• Institute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland

autor

Szerling A.

• Institute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland

autor

Mroziewicz B.

• Institute of Electron Technology, al. Lotników 32/46, 02-668 Warszawa, Poland

Bibliografia

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• [3] Mansanares A.m., Roger J.P., Fournier D., Boccara A.C., Temperature field determination of InGaAsP/lnP lasers by photothermal microscopy: evidence for weak nonradiative processes at the f^acets, Applied Physics Letters 64(1), 1994, pp. 4-6.
• [4] PICS 3D Instruction Manual, Crosslight Software Inc., CA 1998.
• [5] Menzel U., Barwolff A., Enders P., Ackermann D., Puchert R., Voss M., Modelling the temperature dependence of threshold current, external differential efficiency and lasing wavelength in QWlaser diodes, Semiconductor Science and Technology 10(10), 1995, pp. 1382-92.