Rapid detection of trace chloroethylenes sing laser mass spectrometry

• Autorzy: Ma J. , Ding L. , Fang L. , Zheng H. , Gu X. , Zhang W.
• Języki publikacji: EN

Abstrakty

EN

Laser mass spectrometry is a new chemical trace analysis method with high selectivity, sensitivity and speed. The mass-resolved resonance-enhanced multiphoton ionization (REMPI) spectra of chloroethylenes-trichloroethylene and tetrachloroethylene are firstly reported in the range 305.0-325.0 nm. The mass-resolved excited spectra and laser power index of fragment ions CCl+ are presented. The experimental results indicate that 310.8 nm is the suitable ionization wavelength for detection of trichloroethylene and 322.5 nm for the detection of tetrachloroethylene in this wavelength range. The detection limits of these two chloroethylenes of concentration range expressed in ug/L are presented.

Słowa kluczowe

EN

laser mass spectrometry; resonance-enhanced multiphoton ionization; time-of-flight mass spectrometry; chloroethylenes

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2005
• Tom: Vol. 35, nr 2
• Strony: 395--402
• Opis fizyczny: Bibliogr. 18 poz., wykr.

Twórcy

autor

Ma J.

• Laboratory of Environmental Spectroscopy, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 230031 Hefei, China

autor

Ding L.

• Laboratory of Environmental Spectroscopy, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 230031 Hefei, China

autor

Fang L.

• Laboratory of Environmental Spectroscopy, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 230031 Hefei, China

autor

Zheng H.

• Laboratory of Environmental Spectroscopy, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 230031 Hefei, China

autor

Gu X.

• Laboratory of Environmental Spectroscopy, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 230031 Hefei, China

autor

Zhang W.

• Laboratory of Environmental Spectroscopy, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 230031 Hefei, China

Bibliografia

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