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A measurement system for calculation the I-V curves of nanowires
Konferencja
Metrologia Kwantowa ; 09-10.05.2006 ; Poznań, Polska
Języki publikacji
Abstrakty
Przedstawiono system pomiarowy do pomiaru przewodności elektrycznej nanodrutów metalowych podczas ich rozciągania. Nanodruty formowane są pomiędzy powierzchnią próbki metalu i wierzchołkiem metalowej igły. Prezentowany system umożliwia pomiar i wyznaczanie charakterystyk prądowo-napięciowych nanodrutów dla zadanej wartości przewodności nanodrutu. Podano wyniki pomiarów i obliczeń potwierdzające poprawność działania systemu pomiarowego.
This paper presents an experimental setup for measuring the electrical conductance through nanowires during elongation. Nanowires are formed between a metal sample and the tip. We demonstrate how the setup can be used to capture the I-V curves of nanowires. Moreover, it is presented examples of I-V curves which confirm the validity of the proposed method and that the measurement system works well.
Wydawca
Rocznik
Tom
Strony
39--41
Opis fizyczny
Bibliogr. 18 poz., wykr.
Twórcy
autor
- Politechnika Poznańska, Instytut Elektroniki i Telekomunikacji
Bibliografia
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- [3] Kim J. R. et al.: Rectifying diode made on individual GaN nanowire. Physica E, vol. 18, 2003, pp. 225-226.
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Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BWA0-0006-0010