Antirandom Test Vectors for BIST in Hardware/Software Systems

• Autorzy: Mrozek I. , Yarmolik V.
• Języki publikacji: EN

Abstrakty

EN

Antirandom testing has proved useful in a series of empricial evaluations. It improves the fault-detection capability of random testing by employing the location information of previously executed test cases. In antirandom testing we select test pattern (test vector) such that it is as different as possible from all the previous executed test cases. Unfortunately, this method essentially requires enumeration of the input space and computation of each input vector when used on an arbitrary set of existing test data. This avoids scale-up to large test sets and (or) long input vectors. In this paper, we propose a new algorithm for antirandom test generation that is computationally feasible for BIST (Built In Self Test) tests. As the fitness function we use Maximal Minimal Hamming Distance (MMHD) rather than standard Hamming distance as is used in the classical approach. This allows to generate the most efficient test vectors in term of weighted number of generated k-bits tuples. Experimental results are given to evaluate the performance of the new approach.

Słowa kluczowe

EN

antirandom testing; failure pattern; random testing; software testing; hardware testing

• Wydawca: IOS Press
• Czasopismo: Fundamenta Informaticae
• Rocznik: 2012
• Tom: Vol. 119, nr 2
• Strony: 163--185
• Opis fizyczny: Bibliogr. 38 poz., tab., wykr.

Twórcy

autor

Mrozek I.

autor

Yarmolik V.

• Faculty of Computer Science, Bialystok University of Technology, Wiejska 45A, 15-351 Bialystok, Poland,

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