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Antirandom testing has proved useful in a series of empricial evaluations. It improves the fault-detection capability of random testing by employing the location information of previously executed test cases. In antirandom testing we select test pattern (test vector) such that it is as different as possible from all the previous executed test cases. Unfortunately, this method essentially requires enumeration of the input space and computation of each input vector when used on an arbitrary set of existing test data. This avoids scale-up to large test sets and (or) long input vectors. In this paper, we propose a new algorithm for antirandom test generation that is computationally feasible for BIST (Built In Self Test) tests. As the fitness function we use Maximal Minimal Hamming Distance (MMHD) rather than standard Hamming distance as is used in the classical approach. This allows to generate the most efficient test vectors in term of weighted number of generated k-bits tuples. Experimental results are given to evaluate the performance of the new approach.
Wydawca
Czasopismo
Rocznik
Tom
Strony
163--185
Opis fizyczny
Bibliogr. 38 poz., tab., wykr.
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autor
autor
- Faculty of Computer Science, Bialystok University of Technology, Wiejska 45A, 15-351 Bialystok, Poland, i.mrozek@pb.edu.pl
Bibliografia
- [1] Barzilai, Z., Coppersmith, D., Rozenberg, A.: Exhaustive Generation of Bit Pattern with Application to VLSI Self-Testing, IEEE Transactions on Computers, c-31(2), 1983, 190-194.
- [2] Chen, T. Y., Kuo, F.-C., Merkel, R. G., Tse, T. H.: Adaptive Random Testing: The ART of test case diversity, Journal of Systems and Software, 83, January 2010, 60-66.
- [3] Chen, T. Y., Leung, H., Mak, I. K.: Adaptive Random Testing, Advances in Computer Science ASIAN 2004, 3321, 2004, 320-329.
- [4] Ciupa, I., Leitner, A., Oriol, M., Meyer, B.: Object distance and its application to adaptive random testing of object-oriented programs, Proceedings of the 1st international workshop on Random testing, RT '06, ACM, New York, NY, USA, 2006.
- [5] Das, D., Karpovsky, M.: Exhaustive and Near-Exhaustive Memory Testing Techniques and their BIST Implementations, Journal of Electronic Testing: Theory and Applications, 10, June 1997, 215-229.
- [6] Duran, J. W., Ntafos, S. C.: An Evaluation of Random Testing, IEEE Transaction on Software Engineering., 10(4), 1984, 438-444.
- [7] Furuya, K.: A probabilistic approach to locally exhaustive testing, IEEE Transactions on IEICE, E72(5), 1989, 656-660.
- [8] Geng, J.; Zhang, J.: A new method to solve the "Boundary Effect" of Adaptive random testing, Proceedings of the International Conference on Educational and Information Technology, 1, Chongqing, 2010.
- [9] Grindal, M., Offutt, J., Andler, S. F.: Combination testing strategies - a survey, Technical Report ISE-TR-04-05, GMU Technical Report, July 2004.
- [10] Gupta, S., Rajski, J., Tyszer, J.: Arithmetic Additive Generators of Pseudo-Exhaustive Test Patterns, IEEE Transactions on Computers, 45, 1996, 939-949.
- [11] Hartman, A., Raskin, L.: Problems and algorithms for covering arrays, Discrete Mathematics, 284(1-3), 2004, 149-156.
- [12] Karpovsky, M., Yarmolik, V. N.: Transparent random access memory testing for pattern sensitive faults, Journal of Electronic Testing: Theory and Applications, 9(3), 1996, 251-266.
- [13] Karpovsky, M. G., Yarmolik, V. N.: Transparent Memory BIST, Proceedings of the IEEE Workshop on Memory Technology Design and Testing, IEEE Computer Society, San Jose, USA, 1994.
- [14] Kuhn, R. D., Okum, V.: Pseudo-Exhaustive Testing for Software, Proceedings of the 30th Annual IEEE/NASA Software Engineering Workshop, IEEE Computer Society, Washington, DC, USA, 2006.
- [15] Liu, H., Xie, X., Yang, J., Lu, Y., Chen, T. Y.: Adaptive Random Testing by Exclusion through Test Profile, Proceedings of the 10th International Conference on Quality Software, QSIC '10, IEEE Computer Society, Washington, DC, USA, 2010.
- [16] Malaiya, Y. K.: Antirandom Testing: Getting The Most Out Of Black-Box Testing, Proceedings of 6th IEEE International Symposium on Software Reliability Engineering, ISSRE '95, IEEE Computer Society, 1995.
- [17] Malaiya, Y. K., von Mayrhauser, A., Srimani, P. K.: An Examination of Fault Exposure Ratio, IEEE Transaction on Software Engineering., 19, November 1993, 1087-1094.
- [18] Malaiya, Y. K., Yang, S.: The Coverage Problem for Random Testing, Proceedings of the IEEE International Test Conference, ITC '84, IEEE Computer Society, Philadelphia, PA, 1984.
- [19] Mayrhauser, A., von, Bai, A., Chen, T., Anderson, C., Hajjar, A.: Fast Antirandom (FAR) Test Generation, Proceedings of 3rd IEEE International Symposium on High-Assurance Systems Engineering, HASE '98, IEEE Computer Society, Washington, DC, USA, 1998, ISBN 0-8186-9221-9.
- [20] McCaffrey, J. D.: .NET Test Automation Recipes: A Problem-Solution Approach, Apress, Berkely, CA, USA, 2006.
- [21] McCaffrey, J. D.: An Empirical Study of the Effectiveness of Partial Antirandom Testing, Proceedings of the 18th International Conference on Software Engineering and Data Engineering, SEDE, 2009.
- [22] Mrozek, I.: Analysis of multibackground memory testing techniques, International Journal of Applied Mathematics and Computer Science, 20(1), 2010, 191-205.
- [23] Mrozek, I., Yarmolik, V.: Problemy funkcjonalnego testowania pamieci RAM, Bialystok University of Technology, Bialystok, Poland, 2009, ISSN 0867-096X.
- [24] Mrozek, I., Yarmolik, V. N.: Optimal Backgrounds Selection for Multi Run Memory Testing, Proceedings of the IEEE InternationalWorkshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS '08, Bratislava, Slovakia, April 16-18, 2008.
- [25] Reid, S. C.: An Empirical Analysis of Equivalence Partitioning, Boundary Value Analysis and Random Testing, Proceedings of the 4th International Symposium on Software Metrics, IEEE Computer Society, Washington, DC, USA, 1997.
- [26] Seth, S., Agrawal, V., Farhat, H., Siewiorek, D.: A Statistical Theory of Digital Circuit Testability, IEEE Transactions on Computers, 39, 1990, 582-586.
- [27] Sosnowski, J.: Experimental Evaluation of Pseudorandom Test Effectiveness, Proceedings of 24th Euromicro Conference, IEEE Computer Society, Vasteras , Sweden, 1998.
- [28] Tang, D., Woo, L.: Exhaustive Test Pattern Generation with Constant Weight Vectors, IEEE Transactions on Computers, 32, 1983, 1145-1150.
- [29] Tappenden, A., Miller, J.: A Novel Evolutionary Approach for Adaptive Random Testing, IEEE Transactions on Reliability, 58(4), 2009, 619-633.
- [30] Wang, L., McCluskey, E.: Circuits for pseudoexhaustive test pattern generation, IEEE Transactions on CAD of Integrated Circuits and Systems, 1988, 1068-1080.
- [31] Wu, S. H., Jandhyala, S., Malaiya, Y. K., Jayasumana, A. P.: Antirandom testing: a distance-based approach, VLSI Design, 2008, January 2008, 1-2, ISSN 1065-514X.
- [32] Wu, S. H., Malaiya, Y. K., Jayasumana, A. P.: Antirandom vs. pseudorandom testing, Proceedings of IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD '98, 1998.
- [33] Xu, S.: Orderly Random Testing for Both Hardware and Software, Proceedings of the 2008 14th IEEE Pacific Rim International Symposium on Dependable Computing, IEEE Computer Society, Washington, DC, USA, 2008.
- [34] Xu, S., Chen, J.: Maximum Distance Testing, Asian Test Symposium, 2002.
- [35] Yarmolik, S.: Iterative Near Pseudoexhaustive Random Testing, Informatics, 2(26), 2010, 66-75.
- [36] Yarmolik, S. V., Mrozek, I.: Multi background memory testing, Proceedings of the 14th International Conference Mixed design of integrated circuits and systems, MIXDES '07, IEEE Computer Society, Ciechocinek, Poland, June 21-23 2007.
- [37] Yiunn, D., Bin A'ain, A., Khor, Ghee, J.: Scalable test pattern generation (STPG), Proceedings of the Industrial Electronics Applications (ISIEA), 2010 IEEE Symposium on, ISIEA '2010, October 2010.
- [38] Zhou, Z.: Using Coverage Information to Guide Test Case Selection in Adaptive Random Testing, Computer Software and Applications Conference Workshops, 0, 2010, 208-213
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BUS8-0027-0020