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Two dimensional model of CMM probing system

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EN
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EN
A coordinate measuring machine (CMM) as an automation technology is playing the key role in the modern industry to improve the measurement accuracy. Accurate probing that is computer controlled is the current trend for the next generation of coordinate metrology. However, the CMM probing system is limited by its dynamic root errors that may markedly affect its response characteristics. In this paper, dynamic response errors of CMM measurements have been analyzed. The adopted probe stylus sizes throughout the course of measurements are found to cause some waviness errors during CMM operations due to each of the prescribed angle of the probe tip contact point with the specimen surface and the radius of the stylus tip. Variations in the geometry of the stylus have their consequent effects on its inherent intrinsic dynamic characteristics that in turn would cause relevant systematic root errors in the resulted measurements. Unforeseeable geometrical errors of a CMM using a ductile touch-trigger probing system have been characterized theoretically. These results are analyzed in order to investigate the effect of the dynamic root errors in the light of six probe stylus tip of the situation into account when assessing the accuracy of the CMM measurements. Analytical approaches have been applied on a developed two dimensional model (2DM) of stylus tip to demonstrate the capability of such approaches of emphasizing the root error concept using the strategy of CMM ductile trigger type of probe.
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Bibliografia
  • [1] Hermann G., Geometric error correction in coordinate measurement, Acta Polytechnica Hungarica, vol. 4, no. 1, 2007, pp. 47-62.
  • [2] Krajewski G., Woźniak W., “One dimensional kinetic model of CMM passive scanning probes”, Journal of Automation, Mobile Robotics & Intelligent Systems, vol. 3, no. 4, 2009, pp. 172-174.
  • [3] Jae-jun Park, Kihwan Kwon, Nahmgyoo Cho, Development of a Coordinate measuring machine (CMM) touch probe using a multi-axis force sensor. Meas. Sci. Technology, vol. 17, 2006, pp. 2380-2386.
  • [4] Woźniak A., Dobosz M., “Influence of measured objects parameters on CMM touch trigger probe accuracy of probing”, Precision Engineering, Elsevier Inc., vol. 29, issue 3, 2005, pp. 290-297.
  • [5] Kasparaitis A., Sukys A., Dynamic errors of CMM probes, diffusion and defect data. solid state data. Part B, ISSN 1012-0394, vol. 113, 2006, pp. 477-482.
  • [6] Wu Y., Liu S., Zhang G., “Improvement of coordinate measuring machine probing accessibility”, Precision Engineering, vol. 28, 2004, pp.89-94.
  • [7] Yagüe J.-A., Albajez J.-A., Velázquez J., Aguilar J.-J., “A new out-of-machine calibration technique for passive contact analog probes“, Measurement, Elsevier Ltd., vol. 42, 2009, pp. 346-357.
  • [8] Woźniak A., Mayer J. R. R., Bałaziński M., “Stylus tip envelop method: corrected measured point determination in high definition coordinate metrology”, Int. Journal of Adv. Manuf. Technol., Springer, vol. 42, 2009, pp. 505-514.
  • [9] Ali S.H.R., “The Influence of fitting algorithm and scanning speed on roundness error for 50 mm standard ring measurement using CMM”, Int. Journal of Metrology & Measurement Systems, Polish Academy of Sciences, Warsaw, Poland, vol. 15, 2008, no. 1, pp. 31-53.
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  • [12] Dobosz M., Woźniak A., “CMM touch trigger probes testing using a reference axis”, Precision Engineering, Elsevier Inc, vol. 29, 2005, issue 3, pp. 281-289.
  • [13] Yagüe J.-A., Albajez J.-A., Velázquez J., Aguilar J.-J., A new out-of-machine calibration technique for passive contact analog probes", Measurement, Elsevier Ltd., vol. 42, 2009, pp. 346-357.
  • [14] Lin Y. C., Sun W. I., “Probe radius compensated by the multi-cross product method in free form surface measurement with touch trigger probe CMM”, Int. Journal of Adv. Manuf. Technol. Springer, vol. 21, 2003, pp. 902–909.
  • [15] Li L., Jung J.-Y., Lee Ch.-M., Chung W.-J., “Compensation of probe radius in measuring free-formed curves and surface“, Int. Journal of the Korean Society of Precision Engineering, Springer, vol. 4, no. 3, 2003.
  • [16] Xiong Z., Li Z., “Probe radius compensation of workpiece localization”, ASME Transactions, vol. 125, February 2003, pp. 100-104.
  • [17] Zhao J., Fei Y. T., Chen X. H., Wang H. T., “Research on high-speed measurement accuracy of coordinate measuring machines“, Journal of Physics: 7 Int. Symposium on Measurement Technology and Intelligent Instruments, Conf. series 13, 2005, pp. 167-170.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BUJ7-0011-0001
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