Reduction of random telegraph signal (RTS) noise in CMOS image sensors using histogram analysis

• Autorzy: bin Mustafa M. A. , Itoh S. , Kawahito S.
• Konferencja: 8th International Conference on Global Research and Education – Inter-Academia 2009
• Języki publikacji: EN

Abstrakty

EN

The paper presents column parallel signal processing techniques for reducing Random Telegraph Signal (RTS) noise of in-pixel source follower by using histogram analysis for the development of a very low-noise CMOS image sensor. In this method, a histogram with multiple samples for reset level is used to estimate the amplitude of the RTS noise. With the median of the histogram and the estimated amplitude, the RTS noise components are removed and the average is calculated with the histogram due to thermal noise only, to further reduce the noise level. Result of the application of the histogram-based noise suppres-sion to an implemented CMOS image sensor prototype for a large sampling numbers is demonstrated.

Słowa kluczowe

EN

histogram analyses; random telegraph signal (RTS) noise; CMOS image sensor; low-noise; estimated amplitude

• Wydawca: Łukasiewicz Industrial Research Institute for Automation and Measurements PIAP
• Czasopismo: Journal of Automation Mobile Robotics and Intelligent Systems
• Rocznik: 2009
• Tom: Vol. 3, No. 4
• Strony: 202--203
• Opis fizyczny: Bibliogr. 4 poz., rys.

Twórcy

autor

bin Mustafa M. A.

autor

Itoh S.

autor

Kawahito S.

• Graduate School of Science and Technology, Shizuoka University, Japan,

Bibliografia

• [1] Kawahito S., Kawai N., “Column parallel signal processing techniques for reducing thermal and random telegraph noise in CMOS image sensor”, Int. Image Sensors Workshop, Maine, June 2007.
• [2] Konczakowska A., Cichosz J., Szewczyk A., “A new method for identification of RTS noise”, Bulletin of the Polish Academy of Science Technical Science, vol. 54, no. 4, 2006.
• [3] Kawai N., Kawahito S., “Effectiveness of a correlated multiple sampling differential average for reducing 1/f noise”, IEICE Electronics Express, vol.2, no. 13, Jul. 2005, pp. 379-383.
• [4] Kawai N., Kawahito S., “Measurement of low-noise column readout circuits for CMOS image sensors”, IEEE Trans. Electron Devices, vol. 53, no. 7, Jul. 2006, pp. 1737-1739.