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Formation of "black silicon" on a surface of Ni/Si structure by Nd:YAG laser radiation

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Warianty tytułu
Konferencja
8th International Conference on Global Research and Education – Inter-Academia 2009
Języki publikacji
EN
Abstrakty
EN
We have shown the possibility to form a new type of material known as "black silicon". After irradiation of a Si sample surface, covered with 30 nm thick Ni layer, by Nd: YAG laser beam at intensity 4.5 MW/cm2 the "black silicon" was formed. The formation and self-organization of conelike microstructures on the Ni/Si surface has been detected by scanning electron microscope (SEM). Light is repeatedly reflected between the cones in the way that most of it is absorbed, therefore the surface becomes like a "black body" absorber. The micro-chemical analysis performed on SEM has shown that the microstructures contain NiSi2. This was approved by presence of LO phonon line in Raman back scattering spectrum. The control of micro-cone shape and height was achieved by changing the laser intensity and number of pulses.
Twórcy
autor
autor
autor
autor
  • Riga Technical University, 14 Azenes Str., Riga, LV-1048, Latvia; Institute of Semiconductor Physics National Academy of Science of Ukraine, 45 Pr. Nauki, 252650, Kyiv-28, Ukraine
Bibliografia
  • [1] Halbwax M., Sarnet T., Delaporte Ph., Sentis M., Etienne H., Torregrosa F., Vervisch V., Perichaud I., Martinuzzi S., “Micro and nano-structuration of silicon by femtosecond laser: Application to silicon photovoltaic cells fabrication”. Thin Solid Films, 2008 vol. 516, pp. 6791-6795.
  • [2] http://www.technologyreview.com/energy/21611/
  • [3] Liu S., Zhu J., Liu Y., Zhao L., Laser induced plasma in the formation of surface-microstructured silicon . Materials Letters , 2008, vol. 62, pp. 3881-3883.
  • [4] Jeon M., Uchiyama H., Kamisako K., “Characterization of Tin-Catalyzed Silicon Nanowires Synthesized by the Hydrogen radical-assisted Deposition method”. Materials Letters, 2009, vol. 63, pp. 246-248.
  • [5] Jeon M., Kamisako K., “Aspect of aluminumcatalyzed silicon nanowires synthesized at low temperature and effect of hydrogen radical treatment”. Journal of Alloys and Compounds, 2009, vol. 476, pp. 84-88.
  • [6] Zhao F.F., Chen S.Y., Shen Z.X., Gao X.S., Zheng J.Z., See A.K., Chan L.H., “Applications of micro-Raman spectroscopy in salicide characterization for Si device fabrication”. Journal of Vacuum Science and Technology, 2003, vol. B 21, pp. 862-867.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BUJ7-0006-0041
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