The Synthesis and Morphology of TlxSy Layers Deposited on the Surface of Polyethylene Films from Solution

• Autorzy: Bruzaite I. , Snitka V. , Janickis V.
• Języki publikacji: EN

Abstrakty

EN

Thal lium sul fide layers will be formed on the surface of low-density polyethylene (PE) if the PE layer is sulphured in a solution of higher polythionic acid H2S33O6, and then immersed in the alkaline solution of thallium(I) sulfate. Sulphurcon centration in creases on PE sur face with the in crease of the sulphurization time. The amount of thallium in the TlxSy layers depends on a sulphur concentration sorbed-diffused into PE. Three phases TlS, Tl2S and Tl2S2 were identified by X-ray diffraction analysis in thallium sulfide layers. Scanning Electron (SEM) and Atomic Force (AFM) microscopies were used to characterize surface morphology of thallium sulfide layers. The films de posited on the PE surface have a non-homogeneous structure and consist of separated is lands. The process of their growth on PE surface starts from nucleation sites creating is lands of TlS with diameter in tenths of microns which increase up to 9 mi during 1 h deposition.

Słowa kluczowe

EN

high polythionic acid; sulphurization; thallium sulfide layer

• Wydawca: Polskie Towarzystwo Chemiczne
• Czasopismo: Polish Journal of Chemistry
• Rocznik: 2007
• Tom: Vol. 81, nr 12
• Strony: 2031--2038
• Opis fizyczny: Bibliogr. 15 poz., rys.

Twórcy

autor

Bruzaite I.

autor

Snitka V.

autor

Janickis V.

• Department of Inorganic Chemistry, Kaunas University of Technology, Radvilënu 19, LT -50254, Kaunas, Lithuania 2Re search Centre for Microsystems and Nanotechnology, Kaunas University of Technology, Studentu 65, Kaunas, Lithuania,

Bibliografia

• 1. www.ndt-ed.org/EducationResources/CommunityCollege/Other%20Methods/IRT/IR_History.htm
• 2. Ashraf I.M., Elshaikh H. and Badr A.M., Cryst. Res. Technol., 39, 63 (2004).
• 3. Megahid N.M., Chinese. Phys., 41, 2 (2003).
• 4. Elshaikh H.A., Ashraf I.M. and Badr A.M., Phys. Chem. B, 108, 11327 (2004).
• 5. Greenwood N.N and Earnshaw A., Chemistry of the Elements, Pergamon Press, Oxford, New York., 1984, p. 1544.
• 6. Janičkis J., Valančiunas J., Zelionkaite V., Janičkis V. and Grevys S., Trans. Lithuanian Acad. Sci. Ser. B,3, 83(1975)(inRussian).
• 7. Janičkis V., Ancutiene I. and Bruzaite L, Chem. Techn., 23, 2 (2002) (in Lithuanian).
• 8. Ancutiene I., Janičkis V., Grevys S. And Žebrauskas A., Chemistry, 4, 3 (1996) (in Lithuanian).
• 9. Babko A. and Pilipenko A., Photometric analysis. Method for determination of non-metals, Khimiya, Moscow, 1974 (in Russian).
• 10. Nakamura K. and Kashida S.J., Phys. Soc. Jpn., 62, 3135 (1993).
• 11. Kashida SJ. and Nakamura K.J., Solid State Chem., 110, 264 (1994).
• 12. Goldsmith L.M. and Strouse C.E., J. Am. Chem. Soc., 99, 7580 (1977).
• 13. Radtke A. and Dickson F.W., Am. Mineral, 60, 559 (1975).
• 14. Tudo J. and Jolibois B., C. R. Seances Acad. Sci. Ser. C, 280, 1375 (1975).
• 15. Žebrauskas A. and Lazauskiene R., Chemistry, 4, 25 (l993) (in Russian).