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Tytuł artykułu

The Structire and Certain Properties of the Pzt-Type Thin Film Transducers

Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
By means of X-ray diffraction analysis and Raman spectroscopy the process of crystallisation of PZT-type thin films was studied. RF-magnetron sputtering of the multicomponent ceramic targert ((Pb0.97Ba0.01Ca0.01Sr0.005)(Zr0.52Ti0.46)O3 + 1.4wt.%Bi2O3 + 0.3wt.%GeO) employed to the thin film fabrication. Policrystaline thin films deffering in thickness, content of rhombohedral and tetragonal phases, elementary cell parameters, as well as relative content of pyrochlore and perovskite phases have been obtained. Results of investigation into the pyrochlore-perovskite reconstructive phase transitions (RPT) are discussed. On the basis of the experimental measurements as well as the crystal-chemical analysis of mutal realtions between fluorite-type structure, pyrochlore-type structire, C-phase of rare earths, and perovskite-type structure, an atempt to determine possible mechanism of the observed PRT have been indertaken.
Rocznik
Tom
Strony
405--412
Opis fizyczny
Bibliogr. 12 poz., rys.
Twórcy
autor
  • University of Silesia, Faculty of Engineering, Department of Material Science, 2 Śnieżna St., 41-200 Sosnowiec, Poland
  • Rostov State University, Faculty of Physics, 5, Zorge St., 344-104 Rostov-on-Don, Russia.
autor
  • v
autor
  • University of Minho, Department of Physics, Largo do Paco, 4719 Braga codex, Portugal
autor
  • Rostov State University, Faculty of Physics, 5, Zorge St., 344-104 Rostov-on-Don, Russia.
autor
  • Rostov State University, Faculty of Physics, 5, Zorge St., 344-104 Rostov-on-Don, Russia.
  • Rostov State University, Faculty of Physics, 5, Zorge St., 344-104 Rostov-on-Don, Russia.
Bibliografia
  • 1. E.G.Fesenko, Semeistvo perovskita i segnetoelektrichestvo. Atomizdat, Moskva 1972.
  • 2. M.E.Lines and A.M.Glass, Principles and application of ferroelectric and related materials. Clarendon Press, Oxford 1977
  • 3. N.S.Novosilcev, Dokl. AN SSSR, 85, 6 (1952) 1263-1264
  • 4. E.Savaguchi, Y.Akishige and M.Kobayashi, J.Phys.Soc.Jap., 54,2 (1988)480-482
  • 5. Y.Akishige, G.Oomi and E.Savaguchi, Solid State Commun., 65, 7 (1985) 621-624
  • 6. E.Buixaderas, S.Kamba, J. Petzelt, M.Wada, A.Yamanaka and K.Jnoue, J.Korean Phys. Soc., 32 (1998) 578-580
  • 7. Z.Surowiak and V.P.Dudkevich, Thin ferroelectric films. US, Katowice, 1996
  • 8. J.F.Scott, Ferroelectrics Review, 1, (1998) 1-129
  • 9. L.V.Djenia, D.E.Fainrider, B.P.Mordanov and Yu.A.Vusevker, Piezoelectric ceramic material. Patent No 905220 (USSR)
  • 10. J.F.Scott, Phase Transitions, 30 (1991) 107-110
  • 11. H.Zhang, A.Uusimaki, S.Leppauouri and P.Karjalainen, J. Appl.Phys., 76 (1994) 4294- 4300
  • 12. Y.Matsumuro, Y.Oishi and M.Okuyama, J. Korean Phys.Soc., 32 (1998) 1625-S1628
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BUJ6-0008-0083
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