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Simulation of Exchange-Biased 2d-Interface Using the Random Field Ising Model with a Diluted Lattice

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Języki publikacji
EN
Abstrakty
EN
What is presented here are the preliminary results of exchange-bias simulation of a single ferromagnetic layer (FM) coupled to an antiferromagnetic (AFM) region with a diluted lattice using a Random Field Ising Model approach. Dilution is simulated by locally enhancement of ferromagnetic coupling constants calculated at random positions with a given dilution level. The results show a direct correlation between exchange-bias and a number of unreversed spins at the FM/AFM interface. Within a dilution level, two components were identified; a global random dilution and a local dilution efficiency. The latter is represented by the coupling constant enhancement. Interpretation of this interfacial effect
Rocznik
Tom
Strony
29--43
Opis fizyczny
Bibliogr. 23 poz., rys.
Twórcy
Bibliografia
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  • 12. U. Nowak, K. D. Usadel > J. Keller, P. Miltenyi, B. Beschoten, and G. Giintherodt, “Domain state model for exchange bias. I. Theory”, Phys. Rev. B 66, 14430-14439, (2002)
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Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BUJ6-0007-0102
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