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Application of X-ray fluorescence techniques for the determination of hazardous and essential trace elements in environmental and biological materials

Treść / Zawartość
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The utilization of X-ray fluorescence technique for the determination of trace element concentrations in environmental and biological samples is presented. The analytical methods used include energy dispersive X-ray fluorescence with polarizing secondary targets, total reflection X-ray fluorescence, direct in-situ X-ray fluorescence, and micro-beam X-ray fluorescence spectrometry. These methods were applied to analysis of different samples including soil, water, plant material and airborne particulate matter collected on polycarbonate filters. The performance and achieved detection limits of elements for different techniques, established by measuring appropriate reference standards, are presented. Also described is the utilization of micro-beam X-ray fluorescence technique for studying element distribution in heterogeneous samples and investigating the 2D- and 3D-morphology of minute samples by means of computerized X-ray absorption and X-ray fluorescence tomography. The different X-ray techniques have their unique advantages. The micro-beam X-ray fluorescence set-up has an advantage of producing very well collimated primary X-ray beam (about 15 mm in diameter), in front of which the analyzed sample can be precisely positioned, providing local information about the sample composition. The energy dispersive X-ray fluorescence with secondary targets offers rapid analysis of broad range of elements (Na–U) combined with a simple sample preparation method. Total reflection X-ray fluorescence technique, characterized by the lowest detection limits of elements, has its leading edge in analysis of liquid samples, and dealing with particle size effects in air particulates collected on filter papers. In-situ X-ray fluorescence spectrometers are truly portable and enable on the spot, in field analysis. It is shown that the combination of several XRF methods
Czasopismo
Rocznik
Strony
87--95
Opis fizyczny
Bibliogr. 10 poz., rys.
Twórcy
autor
  • Nuclear Techniques, University of Mining and Metallurgy, 30 Mickiewicza Ave., 30-059 Kraków, Poland
autor
  • Instrumentation Unit, Agency’s Laboratories Seibersdorf, IAEA, A-1400 Vienna, Austria and Faculty of Physics
  • Nuclear Techniques, University of Mining and Metallurgy, 30 Mickiewicza Ave., 30-059 Kraków, Poland
  • Nuclear Techniques, University of Mining and Metallurgy, 30 Mickiewicza Ave., 30-059 Kraków, Poland
autor
  • Instrumentation Unit, Agency’s Laboratories Seibersdorf, IAEA, A-1400 Vienna, Austria and Faculty of Physics
  • ---
  • Instrumentation Unit, Agency's Laboratories Seibersdorf, IAEA, A-1400 Vienna, Austria, Tel.: 00431/ 2600 28244, Fax: 00431/ 2600 28222, S.A.Bamford@iaea.org
Bibliografia
  • 1. Bernasconi G, Dargie M, Jaib MM (1997) Total reflection X-ray fluorescence analysis under various experimental conditions. X-Ray Spectrom 26:203−210
  • 2. Bernasconi G, Haselberger N, Markowicz A, Valković V (1994) Applications of a capillary based X-ray microfluorescence system source. Nucl Instrum Meth B 86:333−338
  • 3. Dargie M, Markowicz A, Tajani A, Valković V (1997) Optimized sample preparation procedures for the analysis of solid materials by total-reflection XRF. Fresenius J Anal Chem 357:589−593
  • 4. http://www.panalytical.com/products/xrf/epsilon 5, June 2003 5. International Atomic Energy Agency (2002) Data acquisition for X-ray microprobe, user’s manual. Computer Manual Series No 17. IAEA, Vienna
  • 6. Larsson S, Engstrom P, Rindby A (1989) X-ray capillary microbeam spectrometer. In: Barret ChS et al. (eds) Advances in X-ray analysis, vol. 33. Plenum Press, New York and London, pp 623−628
  • 7. Schmeling M, Van Grieken RE (2002) Sample preparation for X-ray fluorescence. In: Van Grieken RE, Markowicz AA (eds) Handbook of X-ray spectrometry, 2nd ed. Marcel Dekker Inc., New York, pp 933−970
  • 8. Schramm R, Heckel J (1998) Fast analysis of traces and major elements with ED(P)XRF using polarized X-rays: TURBOQUANT. J Phys IV 8:Pr5−335
  • 9. Wegrzynek D, Markowicz A, Chinea-Cano E (2003) Application of the backscatter fundamental parameter method for in-situ element determination using a portable energy-dispersive X-ray fluorescence spectrometer. X-Ray Spectrom 32:119−128
  • 10. Wegrzynek D, Markowicz A, Chinea-Cano E, Bamford S (2003) Evaluation of the uncertainty of element determination using energy-dispersive X-ray fluorescence technique and the emission-transmission method. X-Ray Spectrom 32:317−335
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BUJ6-0005-0053
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