Segregation in CuPd Alloys Studied by X-ray Photoelectron Spectroscopy Using Lineshape Analysis by the Fuzzy k-Nearest Neighbour Rule

• Autorzy: Lesiak B. , Biliński A. , Jóźwik A.
• Języki publikacji: EN

Abstrakty

EN

The surface segregation process in polycrystalline Cu75Pd25 alloy is investigated. Quantitative and qualitative analyses of selected CuPd alloys with atomic composition Cu25Pd75, Cu50Pd50 and Cu75Pd25 are based on the multiline (ML) approach and the spectra lineshape analysis with the use of a statistical pattern recognition method, called the fuzzy k-nearest neighbour rule (fkNN). The analyzed X-ray photoelectron spectra (XPS), recorded using AlK alfa radiation from 280 eV to 1450 eV, exhibit a varying mean escape depth depending on the investigated photoelectron kinetic energy. The lineshape analysis, allowing to identify qualitatively and quantitatively the atomic composition and structure within the selected electron sampling depth, was shown to be consistent with the results of conventional quantitative analyses, based on measured binding energy shifts and intensities, and applicable for the layer segregation processes.

Słowa kluczowe

EN

CuPd alloys; segregation; quantitative and qualitative analyses; multiline(ML) approach; pattern recognition; fuzzy k-nearest neighbour rule; fkNN

• Wydawca: Polskie Towarzystwo Chemiczne
• Czasopismo: Polish Journal of Chemistry
• Rocznik: 2005
• Tom: Vol. 79 / nr 8
• Strony: 1365--1378
• Opis fizyczny: Bibliogr. 35 poz., rys.

Twórcy

autor

Lesiak B.

• Institute of Physical Chemistry Polish Academy of Sciences, 01-224 Warszawa, Kasprzaka 44/52, Poland

autor

Biliński A.

• nstitute of Biocybernetics and Biomedical Engineering Polish Academy of Sciences,02-109 Warszawa, Trojdena 4, Poland

autor

Jóźwik A.

• Technical University of Łódź, Computer Engineering Department,Al. Politechniki 11, 90-924 Łódź, Poland

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