Characterization of Polyacetylene and Polyacetylene Doped with Palladium

Lesiak, B.; Kosiński, A.; Krawczyk, M.; Zommer, L.; Jablonski, A.; Kövér, L.; Tóth, J.; Varga, D.; Cserny, I.; Zemek, J.; Jiricek, P.

Powiadomienia systemowe

Sesja wygasła!
Sesja wygasła!

Artykuł - szczegóły

Tytuł artykułu

Characterization of Polyacetylene and Polyacetylene Doped with Palladium

Autorzy

Lesiak B. , Kosiński A. , Krawczyk M. , Zommer L. , Jablonski A. , Kövér L. , Tóth J. , Varga D. , Cserny I. , Zemek J. , Jiricek P.

Identyfikatory

Warianty tytułu

Języki publikacji

Abstrakty

Samples of Naarmann polyacetylene, denoted as N-(CH)x, (unstrethed) and polyacetylene doped with Pd have been investigated, being characterized by: (1) conductivity using the four-point ethod, (ii) bulk concentration of Pd using the atomic absorption method, (iii) bulk density using helium pycnometry, (iv) surface coposition by X-ray photoelectron spectroscopy and (v) electron transport parameter, such as the inelastic mean free path, using elasti peak electron spetroscopy. For evaluating the inelastic mean free path, a Ni standard has been applied, using three spectrometers in the electron energy range 200-5000 eV. The experimental values of the inelastic mean free path have been compared with that obtained earlier by Tanuma et al. For Shirakawa polyacetylene and with that resulting from the TPP-2M predictive equation and the G1 predictive formula of Gries. The scatter between the experimental and theoretical inelastic mean free path values has been discussed. The experimental inelastic mean free path values depend on the density of the polymers and the surface composition, associated with the contamination fro the reaction synthesis.

Słowa kluczowe

inelastic mean free path IMFP elastic peak electron spectroscopy EPES polyacetylene

Wydawca

Polskie Towarzystwo Chemiczne

Czasopismo

Polish Journal of Chemistry

Rocznik

2000

Tom

Vol. 74, nr 6

Strony

847--865

Opis fizyczny

Bibliogr. 42 poz., rys.

Twórcy

autor

Lesiak B.

Institute of Physical Chemistry PAS, Kasprzaka 44/52, 01-224 Warszawa, Poland

autor

Kosiński A.

Institute of Physical Chemistry PAS, Kasprzaka 44/52, 01-224 Warszawa, Poland

autor

Krawczyk M.

Institute of Physical Chemistry PAS, Kasprzaka 44/52, 01-224 Warszawa, Poland

autor

Zommer L.

Institute of Physical Chemistry PAS, Kasprzaka 44/52, 01-224 Warszawa, Poland

autor

Jablonski A.

Institute of Physical Chemistry PAS, Kasprzaka 44/52, 01-224 Warszawa, Poland

autor

Kövér L.

Research Institute for Nuclear Physics HAS, P.O.Box 51, H-4001 Debrecen, Hungary

autor

Tóth J.

Research Institute for Nuclear Physics HAS, P.O.Box 51, H-4001 Debrecen, Hungary

autor

Varga D.

Research Institute for Nuclear Physics HAS, P.O.Box 51, H-4001 Debrecen, Hungary

autor

Cserny I.

Research Institute for Nuclear Physics HAS, P.O.Box 51, H-4001 Debrecen, Hungary

autor

Zemek J.

lnstitute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnicka 10, 162 53 Prague 6, Czech Republic

autor

Jiricek P.

lnstitute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnicka 10, 162 53 Prague 6, Czech Republic

Bibliografia

1. Handbook of Conducting Polymers, ed. Teije A. Skotheim, Marcel Dekker, Inc., Basel, V. 1 (1986).
2. Roth S. and Graupner W., Synth. Met., 55-57, 3623 (1993).
3. Pron A., Barta P., Luzny W. and Nizioł J., Cond. Matt. News, 6, 13 (1997).
4. Sobczak J.W., Lesiak B., Jabłoński A., Kosiński A. and Palczewska W., Polish J. Chem., 69, 1732 (1995).
5. Sobczak J.W., Kosiński A., Biliński A., Pielaszek J. and Palczewska W., Advanced Materials for Optics and Electronics, 8, 195 (1998).
6. Lesiak B., Kosiński A., Krawczyk M., Zommer L., Jabłoński A., Zemek J., Jiricek P., Kövér L., Tóth J., Varga D. and Cserny I., Appl. Surf. Sci., 144, 168 (1999).
7. Tanuma S., Powell C.J. and Penn D.R., Surf. Interface Anal., 21, 165 (1994).
8. Gries W.H., Surf. Interface Anal., 24, 38 (1996).
9. Pozniaczek J., Kulszewicz-Bajer I., Zagorska M., Kruczała K, Dyrek K, Bielański A. and Pron A., J. Catal, 132,311 (1991).
10. Hasik M., Pron A., Kulszewicz-Bajer I., Pozniaczek A., Bielański A., Piwowarska Z. and Dziembaj R., Synth. Met., 55-57, 972 (1993).
11. ASTM Standard E673-93, Annual Book of ASTM Standards, ASTM Philadelphia, Vol. 3. 06, p. 739. ASTM Philadelphia (1994).
12. Powell C.J. and Jabłoński A., J. Phys. Chem. Ref. Data, 28, 19 (1999).
13. Powell C.J. and Jabłoński A., NIST Electron Inelastic-Mean-Free-Path Database- Version 1.0, National Institute of Standards, Gaithersburg, MD (1999).
14. Jabłoński A. and Jiricek P., Surf. Sci., 412/413,42 (1998).
15. Lesiak B., Jabłoński A., Prussak Z. and Mrozek P., Surf. Sci., 223, 213 (1989).
16. Lesiak B., Jabłoński A., Zemek J. and Jiricek P., Surf. Interface Anal., 26, 400 (1998).
17. Lesiak B., Jabłoński A., Zemek J., Trchova M. and Stejskal J., Langmuir, 16, 1415 (2000).
18. Naarmann H. and Theophilou N., Synth. Met., 22, 1 (1987).
19. Montgomery H.C., J. Appl. Phys., 42, 2971 (1971).
20. Presz A., Skibska M. and Pilecki M., Powder Handling and Processing, 7, 321 (1995).
21. Kövér L., Varga D., Csemy I., Tóth J. and Tókesi K., Surf. Interface Anal., 19, 9 (1992).
22. Seah M.P., Surf. Sci., 32, 703 (1972).
23. Seah M.P., Surf. Interface Anal., 23, 729 (1995).
24. Vegh J., ECASIA-95 Proceedings, QA-34. Proceedings of 6'1’ European Conference on Application of Surface and Interface Analysis, Montreux, Switzerland, ECASIA-95 (1995).
25. Shirley D.A., Phys. Rev., B5, 4709 (1972).
26. Moulder J.R, Stickle W.E, Sobol P.E. and Bomben K.D., Handbook of X-ray Photoelectron Spectroscopy, Perkin Elmer Co. (1992).
27. Scofield J.H., J. Electron Spectrosc., 8, 129 (1976).
28. Tanuma S., Powell C.J. and Penn D.R., Surf. Interface Anal., 17, 911 (1991).
29. Jiricek P., Czech J. Phys., 44, 261 (1994).
30. Mrozek P., Ph. D. Thesis, Institute of Physical Chemistry, Polish Academy of Sciences, Warszawa (1987), (in Polish).
31. NIST Elastic-Electron-Scattering Cross-Section Database, Standard Reference Data Program, Database 64 (National Institute of Standards and Technology, Gaithersburg, MD, 1996).
32. Arbuckle G.A., Buecheler N.M., Clark C. and Wille A., Synth. Met., 63, 35 (1994); Arbuckle G.A., Buecheler N.M., Hall J.W., Valentine K.G., Lefrant S., Mevellec J.Y. and Mulazzi E., Synth. Met., 79, 183 (1996).
33. Jabłoński A.., Surf. Interface Anal.,20, 317 (1993).
34. Ritsko J.J., Phys. Rev., B26, 2192 (1982).
35. Zemek J., Jiricek P., Hucek S., Lesiak B. and Jabłoński A., Proceedings ofECASIA '99, Surf. Interface Anal., (in press).
36. Chen Y.F., J. Vac., Sci. Technol., A 13, 2665 (1995).
37. Yubero F., Sanz J.M., Ramskov B. and Tougaard S., Phys. Rev., B15, 9719 (1996).
38. Kwei C.M., Wang C.Y. and Tung C.J., Surf. Interface Anal., 26, 682 (1998).
39. Lesiak B., Jabłoński A., Zemek J., Jiricek P. and Lejcek P., Proceedings of ECASIA '99, Surf. Interface Anal., (in press).
40. Marletta G., Nucl. Instr. Meth. Phys. Res., B46, 295 (1990).
41. Chapiro A., Nucl. Instr. Meth. Phys. Res., B32, 111 (1988).
42. Calgagno L. and Foti G., Nucl. Instr. Meth. Phys. Res., B19/20, 895 (1987).

Typ dokumentu

Bibliografia

Identyfikator YADDA

bwmeta1.element.baztech-article-BUJ2-0011-0047