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Tytuł artykułu
Identyfikatory
Warianty tytułu
Języki publikacji
Abstrakty
Crystal structures of 4-phenyl[2.2]paracyclophane (1), C22H20, monoclinic, P21/c, a = 14.7168(3), b = 7.8504(1), c = 15.1773(3) A, _ = 118.100(1), Z = 4; 4-(o-tolyl)[ 2.2]paracyclophane (3), C23H22, monoclinic, Cc, a = 11.354(1), b = 22.960(2), c = 7.7156(7)A, _ = 128.824(1), Z = 4; and 4-(2_,4_,6_-trimethylphenyl)[2.2]paracyclophane (6), C25H26, orthorhombic, Pbca, a = 12.892(4), b = 8.091(2), c = 35.895(9) A, _ = 90, Z = 8 have been determined. The interplanar angles between the aryl substituent and the cyclophane ring, to which they are bonded, are 38.0, 50.2 and 56.9_ in 1, 3 and 6, respectively. For 3, the methyl group of the substituent points away from the cyclophanyl cavity.
Słowa kluczowe
Wydawca
Czasopismo
Rocznik
Tom
Strony
1351--1360
Opis fizyczny
Bibliogr. 10 poz., rys.
Twórcy
autor
- Department of Chemistry, Silesian University, 9 Szkolna Street, 40-006 Katowice, Poland
autor
- Department of Chemistry and Biochemistry, Brigham Young University, Provo, Utah 84602, USA
autor
- Department of Chemistry and Biochemistry, Brigham Young University, Provo, Utah 84602, USA
autor
- Department of Chemistry, The University of Alabama, Tuscaloosa, Alabama, 35487, USA
autor
- Department of Chemistry and Biochemistry, Texas Tech University, Lubbock, Texas 79409, USA
Bibliografia
- 1. Hope H., Bernstein J. and Trueblood K.N., Ada Cryst., B28, 1733 (1972).
- 2. Jones P.G. and Kuś P., Polish J.Chem., 72, 1999 (1998).
- 3. Jones P.G. and Kuś P., Polish J.Chem., 73, 707 (1999).
- 4. Kuś P. and Zemanek A., Polish J.Chem., 59, 281 (1985).
- 5. Kuś P., Polish J.Chem., 68, 1983 (1994).
- 6. SMART Software Reference Manual, Version 4.050, Bruker Analytical X-ray Systems, Inc., Madison, WI, 1994-1996.
- 7. SAINT Software Reference Manual, Version 4.050, Bruker Analytical X-ray Systems, Inc., Madison, WI, 1994-1996.
- 8. Sheldrick G.M., SHELXTL, Version 5.05, Siemens Analytical X-Ray Instruments, Inc., Madison, Wisconsin, 1996.
- 9. Sheldrick G.M., SHELXTL-PLUS, Siemens Analytical X-Ray Instruments, Inc., Madison, Wisconsin, 1990.
- 10. Sheldrick G.M., SHELXTL PC, Version 5.03, Bruker X-Ray Systems, Inc., Madison, Wisconsin, 1995.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BUJ1-0019-0043
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