Tytuł artykułu
Autorzy
Identyfikatory
Warianty tytułu
Języki publikacji
Abstrakty
Słowa kluczowe
Wydawca
Czasopismo
Rocznik
Tom
Strony
751--754
Opis fizyczny
Bibliogr. 18 poz., rys.
Twórcy
autor
- Department of Applied Chemistry, Qingdao Institute of Chemical Technology,Qingdao 266042, P. R. China
autor
- Department of Applied Chemistry, Qingdao Institute of Chemical Technology,Qingdao 266042, P. R. China
autor
- Department of Applied Chemistry, Qingdao Institute of Chemical Technology,Qingdao 266042, P. R. China
autor
- Department of Applied Chemistry, Qingdao Institute of Chemical Technology,Qingdao 266042, P. R. China
Bibliografia
- 1.Archer C.M., Dilworth J.R., Jobanputra P., Thomposon R.M., McPartlin M. and Hiller W., J. Chem. Soc., Dalton Trans., 897 (1993).
- 2.Shapiro P. J., Henling L.M., Marsh R.E. and Bercaw J.E., Inorg. Chem., 29, 4560 (1990).
- 3.Latham J.A. and Leigh G.J., J. Chem. Soc., Dalton Trans., 399 (1986).
- 4.Abrams M.J., Larsen S.K. and Zubieta J., Inorg. Chem., 30, 2031 (1991).
- 5.Wang M.F., Volkert E.W., Singh P.R., Katti K.K., Lusiak P., Katti K.V. and Barnes C.L., Inorg. Chem., 1184 (1994).
- 6.Katti K.V., Singh P.R. and Barnes C.L., Inorg. Chem., 31, 4588 (1992).
- 7.Majoral J.P., Kraemer R,, Navech J. and Mathis F., Polyhedron, 32, 2633 (1976).
- 8.Koziara A. and Turski K., Synthesis. 40. 298 (1986).
- 9.Bargrov F.V., Zh. Obsh. Khim., 60(5), 1028 (1990).
- 10.Gou S.H., You X.Z., Xu Z., Yu K.B. and Zhou Z.Y., Polyhedron, 24. 2981 (1990).
- 11.Duan C.Y., You X.Z. and Mak T.C.W., Acta Cryst., C54, 31 (1998).
- 12.Duan C.Y., Tian Y.P., Lu Z.L., You X.Z. and Mak T.C.W., Polyhedron, 46, 59 (1998).
- 13.You X.Z., Xiong R.G., Dong J.X. and Huang X.Y., Polyhedron, 19, 2763 (1994).
- 14.Huang X.Y, Xiong R.G. and You X.Z., Acta Cryst., C51, 2261 (1995).
- 15.Xiong R.G., You X.Z. and Huang X.Y., Acta Cryst., C51. 2263 (1995).
- 16.Sheldrick G .M., SADABS, Program for Empirical Absorption Correction of Area Detector Data, University of Gottingen, Germany (1996).
- 17.Sheldrick G.M., SHELXTL, v5 Reference Manual, Siemens Analytical X-ray Systems, Inc., Madison, Wisconsin, USA (1996).
- 18.Wilson A.J.C., International Tables for X-ray Crystallography, volume C (1992), Kluwer Acad. Publ., Dordrecht, Tables 6.1.1.4 (pp. 500-502) and 4.2.6.8 (pp. 219-222) respectively.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BUJ1-0017-0055