Symulacja błędów przemijających w mikrokontrolerze satelitarnym

• Autorzy: Iwiński M. , Sosnowski J.

Warianty tytułu

EN

Transient fault simulation in a satellite microcontroller

• Języki publikacji: PL

Abstrakty

PL

W wielu zastosowaniach mikrokontrolerów należy brać pod uwagę wpływ na ich pracę błędów przemijających (zakłócenia elektromagnetyczne, promieniowanie kosmiczne itp.). Artykuł przedstawia metodę badania odporności na błędy przemijające w mikrokontrolerach. Bazuje ona na opracowanej platformie symulatora sprzężonego z obiektem badanym poprzez interfejs RS232C. Technika ta została zweryfikowana w badaniu mikrokon-trolera przeznaczonego do sterowania zasilaniem pokładowym satelity. W artykule przedstawiono wyniki eksperymentów oraz wskazano możliwości programowego zwiększania odporności na błędy.

EN

In many microcontroller applications the impact of transient faults (electromagnetic disturbances, cosmic radiation, etc.) on their operation has to be taken into account. The paper presents a new methodology of testing transient fault robustness in microcontrollers. It is based on the developed fault injection platform which is coupled to the tested object via RS 232C interface. A tested object (microcontroller) cooperates with real or modelled environment (partially controlled by a simulator). This technique has been successfully applied to testing a microcontroller used for managing the satellite on-board power subsystem (solar cells, batteries, power accumulation and distribution), Many transient fault simulation experiments have been performed and their results interpreted. In particular, there has been analysed the impact of faults on correct control flow of the program. Some simple fault detection and error recovery mechanisms have been included in the considerations. The presented methodology can be easily extended for other microcontrollers and communication interfaces. Time and code overheads are negligible so the simulation results are quite realistic.

Słowa kluczowe

PL

systemy wbudowane; mikrokontrolery; symulacja błędów; niezawodność

EN

embedded system; microcontrollers; fault simulation; reliability

• Wydawca: Wydawnictwo PAK
• Czasopismo: Pomiary Automatyka Kontrola
• Rocznik: 2011
• Tom: R. 57, nr 8
• Strony: 822--824
• Opis fizyczny: Bibliogr. 12 poz., rys., tab.

Twórcy

autor

Iwiński M.

autor

Sosnowski J.

• Instytut Informatyki, Politechnika Warszawska, ul. Nowowiejska 15/19, 00-665 Warszawa,

Bibliografia

• [1] Arla J. i inni: Comparison of physical and software-implemented fault injection techniques, IEEE Trans. on Computers, vol. 52, no. 9, 2003, 1115-1133.
• [2] Benso A., Prinetto P.: Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation. Kluwer Academic Publishers, 2003.
• [3] Campagna S., Violante M.: A framework to support the design of COTS based reliable space computers for on-board data handling, Proc. of IEEE IOLTS Symposium, 2010, pp .91-96.
• [4] Gawkowski P., Sosnowski J.: Experiences with software implemented fault injection, Proc. of the International Conference on Architecture of Computing Systems, VDE Verlag GMBH, 2007, 73-80.
• [5] Rebaudengo M., Reorda M., Villante M.: A new software based technique for low cost fault tolerant application, Proc. of IEEE Annual Reliability and Maintainability Symposium, 2003, 23-28.
• [6] Skarin D., Karlsson J.: Software implemented detection and recovery of soft errors in a break by wire system, Proc. of 7th European Dependable Computing Conference, IEEE Comp. Soc., 2008, 145-154.
• [7] Lovellette M. N. i inni: Strategies for Fault-Tolerant, Space-Based Computing: Lessons Learned from the ARGOS Testbed, Aerospace Conference Proceedings, 5-2109-5-2119 vol. 5, 2002.
• [8] Sera D. i inni: Improved MPPT algorithms for rapidly changing environmental conditions, Aalborg University/Institute of Energy Technology, Aalborg, Denmark.
• [9] Oh N., Shirvani P. P., McCluskey E. J.: Control-flow checking by software signatures, IEEE Transactions on Reliability, vol. 51, no. 1, pp. 111-122, 2002.
• [10] Trawczynski D., Sosnowski J., Gawkowski P.: Analyzing fault susceptibility of ABS microcontroller, Proc. International Conference on Computer Safety, Reliability, and Security SAFECOMP’08, Newcastle, U. K, 2008, 320-372.
• [11] Gawkowski P. et al.: Testing Fault Robustness of Model Predictive Control Algorithms. H. Giese (Ed.): ISARCS 2010, LNCS 6150, pp. 109-124, Springer-Verlag Berlin Heidelberg 2010.
• [12] Fidalgo A. V., Alves G. R., Ferreira J. M.: Real Time Fault Injection Using Enhanced OCD - A Performance Analysis, Proceedings of the 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 06), 2006.