Sygnaturowy słownik diagnostyczny o niewielkich rozmiarach wykorzystywany w testowaniu połączeń

• Autorzy: Garbolino T. , Gucwa K. , Hławiczka A.

Warianty tytułu

EN

Small-size signature-based diagnostic dictionary for testing of interconnections

• Języki publikacji: PL

Abstrakty

PL

Przedstawiono nowy sposób redukcji rozmiaru sygnaturowego słownika diagnostycznego (SSD) służącego do detekcji i diagnostyki uszkodzeń statycznych i opóźnieniowych w połączeniach. Testowana magistrala złożona z n linii jest dzielona na b k bitowych fragmentów. Każdy z ww. fragmentów magistrali jest testowany przy użyciu oddzielnego 2k bitowego rejestru pierścieniowego R-LFSR. Procedura testująca obejmuje cztery fazy, w których na przemian pracują parzyste oraz nieparzyste rejestry. Zaproponowane tutaj rozwiązanie pozwala znacznie zmniejszyć wielkość SSD.

EN

The paper is devoted to a new technique enabling the substantial reduction of the size of a diagnostic dictionary used for detection, localization and identification of static and delay faults in interconnections that are tested with use of ring linear feedback shift registers (R-LFSR). The proposed method assumes that the bus under test comprises n lines and is structured into b fragments of the size of k lines per each fragment. The method also assumes that each of the aforementioned fragments is tested by means of a separate R-LFSR with its length of 2k bits. The example of such a solution is presented in Fig. 1. Moreover, the test procedure is subdivided into four phases in which odd and even R-LFSRs work alternately. Operation modes for individual registers during subsequent phases and their seeds are summarized in Table 1. The proposed way of subdivision of the test procedure makes it possible to get rid of the mutual interference between two adjacent R LFSRs in case of occurring a short-circuit between the feedback lines of these neighbouring registers. Such interactions were the drawback of the previous methods and presented the impediment that prevented the fault dictionary from having its size reduced [2]. The solution that is suggested in this study enables substantially diminishing the dictionary, where its actual size is determined by the multiplicity of r defects within each k-bit part of the connecting bus, even when the bus width n >> k [3, 4].

Słowa kluczowe

PL

testowanie połączeń; liniowy rejestr pierścieniowy R-LFSR; słownik diagnostyczny

EN

interconnect test; ring LFSR; diagnostic dictionary

• Wydawca: Wydawnictwo PAK
• Czasopismo: Pomiary Automatyka Kontrola
• Rocznik: 2011
• Tom: R. 57, nr 1
• Strony: 52--54
• Opis fizyczny: Bibliogr. 10 poz., rys., schem., tab.

Twórcy

autor

Garbolino T.

autor

Gucwa K.

autor

Hławiczka A.

• Politechnika Śląska, Instytut Elektroniki, ul. Akademicka 16, 44-100 Gliwice,

Bibliografia

• [1] Attarha A., Nourani M.: Testing interconnects for noise and skew in gigahertz SoC, Proc. of Int. Test Conf. - ITC'01, Baltimore, USA, str. 305-314, 2001.
• [2] Garbolino T. , Gucwa K, Hławiczka A.: How to reduce size of a signature-based diagnostic dictionary used for testing of connections, IEEE Int. Symposium on Design and Diagnostics of Electronic Circuits and Systems - DDECS'10, Vienna, Austria, str. 201 204, 2010.
• [3] Garbolino T., Gucwa K., Hławiczka A.: Testing of interconnections with use of reduced size signature based diagnostic dictionary, Proc. of IEEE Int. Conf. Mixed Design of Integrated Circuits and Systems - MIXDES'10, Wrocław, Poland, str. 486-491, 2010.
• [4] Garbolino T., Gucwa K., Hławiczka A.: Reduced-size Signature-based Diagnostic Dictionary for Interconnection Testing, Proc. of the 10th International IFAC Workshop on Programmable Devices and Embedded Systems - PDeS'10, Pszczyna, Poland, 2010.
• [5] Hławiczka A., Gucwa K., Garbolino T., Kopeć M.: Interconnect faults identification and localization using modified ring LFSR, Proc. of IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems - DDECS'08, Bratislava, Slovakia, str. 247-250, 2008.
• [6] Hławiczka A., Gucwa K., Garbolino T., Kopeć: Application of modified Ring-LFSR for interconnect faults detection, Proc. of IEEE International Conference Mixed Design of Integrated Circuits and Systems – MIXDES'08, Poznań, Poland, str. 487-492, 2008.
• [7] Jutman A.: At-speed on-chip diagnosis of board-level inter-connect faults, IEEE European Test Symposium - ETS'04, Corsica, France, str. 2-9, 2004.
• [8] Koeter J., Sparks S.: Interconnect testing using BIST embedded in IEEE 1149.1 Designs, Proc. of Int. ASIC Conf., str. P11-2.1- P11-2.4, 1991.
• [9] Pendurkar R., Chatterjee A., Zorian Y.: Switching activity generation with automated BIST synthesis for performance testing of interconnects, IEEE Trans. on CAD/ICS, vol. 20, (No 9), str. 1143 1158, 2001.
• [10] Su C., Tseng W.: Configuration free SoC interconnect BIST methodology, Proc. of Int. Test Conf., Baltimore, USA, str. 1033-1038, 2001.