Stimulus with limited band optimization for analogue circuit testing

• Autorzy: Golonek T. , Jantos P. , Rutkowski J.
• Języki publikacji: EN

Abstrakty

EN

The paper presents an analogue circuit testing method that engages the analysis of the time response to a nonperiodic stimulus specialized for the verification of selected specifications. The decision about the current circuit diagnostic state depends on an amplitude spectrum decomposition of the time response measured during the test. A shape of the test excitation spectrum is optimized with the use of a differential evolution algorithm and it allows for achieving maximum fault coverage and the optimal conditions for fault isolation. Genotypes of the evolutionary system encode the amplitude spectrum of candidates for testing stimuli by means of rectangle frequency windows with amplitudes determined evolutionarily.

Słowa kluczowe

EN

analogue circuit testing; faults isolation; evolutionary computations; amplitude spectrum

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2012
• Tom: Vol. 19, nr 1
• Strony: 73--84
• Opis fizyczny: Bibliogr. 20 poz., rys., tab., wykr.

Twórcy

autor

Golonek T.

autor

Jantos P.

autor

Rutkowski J.

• Silesian University of Technology, Faculty Of Automatic Control, Electronics And Computer Science, Institute of Electronics, Akademicka 16, 44-100 Gliwice, Poland,

Bibliografia

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