Jitter measurement on the basis of high-precision event timer

• Autorzy: Artyukh Y. , Boole E.
• Języki publikacji: EN

Abstrakty

EN

Currently the high-precision event timers represent powerful tools for time measurement in various applications, including jitter measurement. Applied potential of this technology is illustrated by the example of clock jitter measurement and analysis based on the application of a high-precision event timer. The basic measurement procedures resulting in estimations of commonly used jitter parameters (such as accumulated jitter, period jitter, clock-to-clock jitter) are discussed. An approach to informal interpretation of statistical jitter characteristics based on theoretical jitter model and results of computer simulation is offered. Experimental results of jitter measurement and analysis for high-precision clock oscillators confirm the assumption that currently the event timing can provide for jitter measurement precision comparable with traditional oscilloscope-based techniques.

Słowa kluczowe

EN

jitter measurement; event timer; accumulated jitter; statistical jitter analysis

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2011
• Tom: Vol. 18, nr 3
• Strony: 453--460
• Opis fizyczny: Bibliogr. 10 poz., rys., tab., wykr.

Twórcy

autor

Artyukh Y.

autor

Boole E.

• Institut of Electronics and Computer Science, 14 Dzerbenes Str., LV-1006 Riga, Latvia,

Bibliografia

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• [8] Zieliński, M., et al. (2009). Accumulated Jitter Measurement of Standard Clock Oscillators. Metrology and Measurement Systems, 16(2), 259-266.
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