PL EN


Preferencje help
Widoczny [Schowaj] Abstrakt
Liczba wyników
Tytuł artykułu

Multiple soft fault diagnosis of nonlinear dc circuits considering component tolerances

Treść / Zawartość
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
This paper is devoted to multiple soft fault diagnosis of analog nonlinear circuits. A two-stage algorithm is offered enabling us to locate the faulty circuit components and evaluate their values, considering the component tolerances. At first a preliminary diagnostic procedure is performed, under the assumption that the non-faulty components have nominal values, leading to approximate and tentative results. Then, they are corrected, taking into account the fact that the non-faulty components can assume arbitrary values within their tolerance ranges. This stage of the algorithm is carried out using the linear programming method. As a result some ranges are obtained including possible values of the faulty components. The proposed approach is illustrated with two numerical examples.
Rocznik
Strony
349--360
Opis fizyczny
Bibliogr. 33 poz., rys., wzory
Twórcy
autor
Bibliografia
  • [1] Bandler, J.W., Salama, A.E. (1985). Fault diagnosis of analog circuits. Proc. IEEE, 73, 1279-1325.
  • [2] Zielonko, R., Królikowski, A. (1988). Measurement-diagnostic methods for analog electronic circuits. WNT, Warszawa. (in Polish)
  • [3] Ozawa, T. (1988). Analog method for computer aided circuit analysis and diagnosis. M. Dekker, New York.
  • [4] Rutkowski, J. (2003). Diagnostic dictionary methods of analog electronic circuits. WKŁ, Warszawa. (in Polish)
  • [5] Kabisatpathy, P., Barua, A., Sinha, S. (2005). Fault diagnosis of analog integrated circuits. Springer, Dordrecht.
  • [6] Rutkowski, J. (1993). A DC approach for analog fault dictionary determination. Proc. Europ. Con. Cir. Theor. Des., ECCTD'93, 877-880.
  • [7] Materka, A., Strzelecki, M. (1996). Parametric testing of mixed-signal circuits by ANN processing of transient responses. Journal of Electronic Testing, 9, 187-202.
  • [8] Fedi, G., Giomi, R., Luchetta, A., Manetti, S. Piccirilli, M. C. (1998). On the application of symbolic techniques to the multiple fault location in low testability analog circuit. IEEE Trans. Cir. Syst. - II, 45, 1383-1388.
  • [9] Tadeusiewicz, M., Korzybski, M. (2000). A method for fault diagnosis in linear electronic circuits. Int. J. Cir. Theor. Appl., 28, 245-262.
  • [10] Catelani, M., Fort, A. (2002). Soft fault detection and isolation in analog circuits: some results and a comparison between a fuzzy approach and radial basis function networks. IEEE Trans. Instrum. Measur., 51, 196-202.
  • [11] Liu, D., Starzyk, J.A. (2002). A generalized fault diagnosis in dynamic analog circuits. Int. J. Cir. Theor. Appl., 30, 487-510.
  • [12] Robotycki, A., Zielonko, R. (2002). Fault diagnosis of analog piecewise linear circuits based on homotopy. IEEE Trans. Instrum. Measur., 51, 876-881.
  • [13] Tadeusiewicz, M., Hałgas, S., Korzybski, M. (2002). An algorithm for soft-fault diagnosis of linear and nonlinear circuits. IEEE Trans. Cir. Syst. - I, 49, 1648-1653.
  • [14] Toczek, W. (2004). Analog fault signature based on sigma-delta modulation and oscillation-test methodology. Metrology and Measurement Systems, XI, 363-375.
  • [15] Starzyk, J., Liu, D., Liu, Z., Nelson, D., Rutkowski, J. (2004). Entropy-based optimum test points selection for analog fault dictionary techniques. IEEE Trans. Instrum. Measur., 53, 754-761.
  • [16] Toczek, W., Kowalewski, M. (2005). A neural network based system for soft fault diagnosis in electronic circuits. Metrology and Measurement Systems, 12(4), 463-374.
  • [17] Tadeusiewicz, M., Hałgas, S. (2006). An algorithm for multiple fault diagnosis in analogue circuits. Int. J. Cir. Theor. Appl., 34, 607-615.
  • [18] Tadeusiewicz, M., Hałgas, S., Sidyk, P. (2007). A method of soft fault diagnosis in transistor circuits. Electronics - Constructions, Technologies, Applications, 11, 31-33. (in Polish)
  • [19] Aminian, M., Aminian, F. (2007). A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor. IEEE Trans. Instrum. Measur., 56, 1546-1554.
  • [20] Golonek, T., Rutkowski, J. (2007). Genetic-algorithm-based method for optimal analog test points selections. IEEE Trans. Cir. Syst. - II, 54, 117-131.
  • [21] Kuczyński, A., Ossowski, M. (2009). Analog circuits diagnosis using discrete wavelet transform of supply current. Metrology and Measurement Systems, 16(1), 77-84.
  • [22] Longfu, Zhou, Yibing, Shi, Jingyuan, Tang, Yanjun, Li. (2009). Soft fault diagnosis in analog circuit based on fuzzy and direction vector. Metrology and Measurement Systems, 16(1), 61-75.
  • [23] Grzechca, D., Rutkowski, J. (2009). Fault diagnosis in analog electronic circuits - the SVM approach. Metrology and Measurement Systems, 16(4), 583-598.
  • [24] Tadeusiewicz, M., Hałgas, S. (2010). A method for fast simulation of multiple catastrophic faults in analogue circuits. Int. J. Cir. Theor. Appl., 38, 275-290.
  • [25] Załęski, D., Bartosiński, B., Zielonko, R. (2010). Application of complementary signals in Built-In Self Testers for mixed-signal embedded electronic systems. IEEE Trans. Instrum. Measur., 59, 345-352.
  • [26] Wei, Zhang, Longfu, Zhou, Yibing, Shi, Chengti, Huang, Yanjun, Li. (2010). Soft-fault diagnosis of analog circuit with tolerance using FNLP. Metrology and Measurement Systems, 17(3), 349-362.
  • [27] Sałat, R., Osowski, S. (2011). Support Vector Machine for soft fault location in electrical circuits. Journal of Intelligent and Fuzzy Systems, 22, 21-31.
  • [28] Tadeusiewicz, M., Hałgas, S., Korzybski, M. (2011). Multiple catastrophic fault diagnosis of analog circuits considering the component tolerances. Int. J. Cir. Theor. Appl., published on line: 29 MAR 2011 | DOI: 10.1002/cta.770
  • [29] Pułka, A. (2011). Two heuristic algorithms for test point selection in analog circuit diagnoses. Metrology and Measurement Systems, 18(1), 115-128.
  • [30] Tadeusiewicz, M., Hałgas, S. (2011). Fault diagnosis of nonlinear circuits considering component tolerances. Proceedings of X National Conference of Electronics, KKE’11, 890-895. CD-ROM. (in Polish)
  • [31] Golub, G.H., Van Loan, C.S. (1996). Matrix Computation. The Johns Hopkins University Press, London.
  • [32] Simonnard, M. (1962). Programmation lineaire. Dunod: Paris.
  • [33] Sierksma, G. (1996). Linear and integer programming: Theory and practice. Marcel Dekker, New York.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BSW1-0083-0001
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.