Systematic effect as a part of the coverage interval

• Autorzy: Fotowicz P.
• Języki publikacji: EN

Abstrakty

EN

The paper concerns the problem of treatment of the systematic effect as a part of the coverage interval associated with the measurement result. In this case the known systematic effect is not corrected for but instead is treated as an uncertainty component. This effect is characterized by two components: systematic and random. The systematic component is estimated by the bias and the random component is estimated by the uncertainty associated with the bias. Taking into consideration these two components, a random variable can be created with zero expectation and standard deviation calculated by randomizing the systematic effect. The method of randomization of the systematic effect is based on a flatten-Gaussian distribution. The standard uncertainty, being the basic parameter of the systematic effect, may be calculated with a simple mathematical formula. The presented evaluation of uncertainty is more rational than those with the use of other methods. It is useful in practical metrological applications.

Słowa kluczowe

EN

measurement uncertainty; coverage interval; systematic effect; randomization

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2010
• Tom: Vol. 17, nr 3
• Strony: 439--446
• Opis fizyczny: Bibliogr. 13 poz., tab., wykr.

Twórcy

autor

Fotowicz P.

• Central Office of Measures, Elektoralna 2, 00-139 Warsaw, Poland,

Bibliografia

• [1] Guide to the Expression of Uncertainty in Measurement. ISO 1995.
• [2] Evaluation of measurement data - Supplement 1 to the Guide - Propagation of distribution using a Monte Carlo method. JCGM 101:2008.
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• [4] P. Fotowicz: “Method of the coverage factor evaluation in procedure for calculating the uncertainty of measurement”. PAR, no. 10, 2003, pp. 13-16. (in Polish)
• [5] P. Fotowicz: “Methods of the coverage factor evaluation basing on the convolution of rectangular and normal distributions”. PAK, no. 4, 2004, pp. 13-16. (in Polish)
• [6] P. Fotowicz: “Calculating expanded uncertainty by means of analytical method basis of convolution of input quantities distributions”. PAR, no. 1, 2005, pp. 5-9. (in Polish)
• [7] P. Fotowicz: “An analytical method for calculating a coverage interval”. Metrologia, vol. 43, 2006, pp. 42-45.
• [8] P. Fotowicz: “Estimation of approximation accuracy of convolution of rectangular and normal distributions by symmetrical trapezoidal distribution”. PAR, no. 5, 2001, pp. 9-11. (in Polish)
• [9] P. Fotowicz: “Principle of distribution approximation of measurement result in calibration”. PAR, no. 9, 2001, pp. 8-11. (in Polish).
• [10]P. Fotowicz: “A method of approximation of the coverage factor in calibration”. Measurement, vol. 35, 2004, pp. 251-256.
• [11]S.D. Phillips, K.R. Eberhardt: “Guidelines for Expressing the Uncertainty of Measurement Results Containing Uncorrected Bias”. Journal of Research of the NIST, vol. 102, 1997, pp. 577-585.
• [12] I.H. Lira, W. Woger: “The evaluation of the uncertainty in knowing a directly measured quantity”. Measurement Science and Technology, vol. 9, 1998, pp. 1167-1173.
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