A method of RTS noise identification in noise signals of semiconductor devices in the time domain

• Autorzy: Stawarz-Graczyk B. , Dokupil D. , Flisikowski P.
• Języki publikacji: EN

Abstrakty

EN

In the paper a new method of Random Telegraph Signal (RTS) noise identification is presented. The method is based on a standardized histogram of instantaneous noise values and processing by Gram-Charlier series. To find a device generating RTS noise by the presented method one should count the number of significant coefficients of the Gram-Charlier series. This would allow to recognize the type of noise. There is always one (first) significant coefficient (c0) representing Gaussian noise. If additional coefficients cr (where r > 0) appear it means that RTS noise (two-level as well as multiple-level) is detected. The coefficient representing the Gaussian component always has the highest value of all. The application of this method will be presented on the example of four devices, each with different noise (pure Gaussian noise signal, noise signal with two-level RTS noise, noise signal with three-level RTS noise and noise signal with not precisely visible occurrence of RTS noise).

Słowa kluczowe

EN

RTS noise; Gram-Charlier series; semiconductor devices; optocouplers

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2010
• Tom: Vol. 17, nr 1
• Strony: 95--107
• Opis fizyczny: Bibliogr. 22 poz., rys., wykr.

Twórcy

autor

Stawarz-Graczyk B.

autor

Dokupil D.

autor

Flisikowski P.

• Gdansk University of Technology, Faculty of Electronics, Telecommunications and Informatics, G. Narutowicza 11, 80-233 Gdańsk, Poland,

Bibliografia

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