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Języki publikacji
Abstrakty
Jitter and phase noise are non-ideal effects that lead to uncertainties in estimating the parameters of a sinusoidal signal. In this paper, the particular case of the bias induced by these effects on the amplitude estimation is considered. An analytical expression is derived for the relative error of amplitude estimation as a function of number of samples and phase noise standard deviation. It is demonstrated that, in the case of coherent sampling, the relative error is independent of sinusoidal amplitude and offset.
Słowa kluczowe
Czasopismo
Rocznik
Tom
Strony
465--478
Opis fizyczny
Bibliogr. 17 poz., wykr., wzory
Twórcy
autor
- Instituto de Telecomunicaçoes e Instituto Superior Técnico, Av. Rovisco Pais, 1, 1049-001 Lisbon, Portugal, falegria@lx.it.pt
Bibliografia
- [1] P. M. Ramos, M.F. da Silva, A. M. da Cruz Serra: “Low Frequency Impedance Measurement Using Sine-Fitting”. Measurement, vol. 35, no. 1, January 2004, pp. 89-96.
- [2] A. L. Ribeiro, H.G. Ramos: “Inductive Probe for Flaw Detection in non-Magnetic Metallic Plates Using Eddy-Currents”. I2MTC 2008 - Instrumentation and Measurement Technology Conference, Victoria - Canada, May 2008.
- [3] O. Postolache, H.G. Ramos, A.L. Ribeiro: “Characterization of Defects in Aluminum Plates Using GMR Probes and Neural Network Signal Processing”. XVI-IMEKO TC4 Symposium, Florence - Italy, September 2008.
- [4] O. Postolache, H.G. Ramos, A.L. Ribeiro: “Detection and Characterization of Defects Using GMR Probes and Artificial Neural Networks”, to be published in Computer Stand. and Interfaces Journal.
- [5] F. Corrêa Alegria, P. Arpaia, P. Daponte, A.M. da Cruz Serra: “An ADC Histogram Test Based on Small-Amplitude Waves”. Measurement, Elsevier Science, vol. 31, no. 4, June 2002, pp. 271-279.
- [6] “IEEE Standard for digitizing waveform recorders”. IEEE Std. 1057-2007, April 2008.
- [7] “IEEE Standard for terminology and test methods for analog-to-digital converters”. IEEE Std. 1241, 2000.
- [8] A.A. Platonov, Ł.M. Małkiewicz: “Particularities of the Cyclic A/D Converters ENOB Definition and Measurement”. Metrol Meas Syst, vol. XV, no. 1, 2008, pp. 9-22.
- [9] J. Vedral, P. Fexa, J. Svatoš: “Methods for Economical Test of Dynamic Parameters DCs”. Metrol Meas Syst, vol. XVI, no. 1, 2009, pp. 161-170.
- [10] P. Händel, A. Host-Madsen: “Estimation of velocity and size of particles from two channel laser anemometry Measurements”, Measurement, vol. 21, no. 3, July 1997, pp. 113-123.
- [11] J. Jakubiec: “Linearity Error as Component of A/D Converter Uncertainty”, Metrol Meas Syst, vol. XV, no. 3, 2008, pp. 329-343.
- [12] F. Corrêa Alegria: “Bias of Amplitude Estimation Using Three-Parameter Sine Fitting in the Presence of Additive Noise”. Measurement, Elsevier Science, vol. 42, no. 5, June 2009, pp. 748-756.
- [13] F. Corrêa Alegria: “Precision of Harmonic Amplitude Estimation on Jitter Corrupted Data”, submitted to Measurement.
- [14] F. Corrêa Alegria, A.M. da Cruz Serra: “Gaussian Jitter Induced Bias of Sine Wave Amplitude Estimation Using Three-Parameter Sine Fitting”, submitted to the IEEE Transactions on Instrumentation and Measurement.
- [15] T.M. Souders, D.R. Flach, C. Hagwood, G.L. Yang: “The Effects of Timing Jitter in Sampling Systems”. IEEE Transactions on Instrumentation and Measurement, vol. 39, no. 1, February 1990, pp. 80-85.
- [16] A. Papoulis: Probability, Random Variables and Stochastic Processes. McGraw-Hill, 3rd edition, 1991.
- [17] I.P. Zakharov, S.V. Vodotyka: “Application of Monte Carlo Simulation for The Evaluation of Measurements Uncertainty”. Metrol Meas Syst, vol. XV, no. 1, 2008, pp. 117-123.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BSW1-0059-0011