Global parametric fault identification in analog electronic circuits

• Autorzy: Jantos P. , Grzechca D. , Rutkowski J.
• Języki publikacji: EN

Abstrakty

EN

A method of global parametric fault diagnosis in analog integrated circuits is presented in this paper. The method is based on basic features calculated from a circuit under the test's time domain response to a voltage step, i.e. locations of maxima and minima of the circuit-under-test response and its first order derivative. The testing and diagnosis process is executed with the use of an artificial neural network. The neural network is supplied with extracted basic features. After evaluation and discrimination, the output indicates the circuit state. The proposed diagnosis method has been verified with the use of exemplary integrated circuits - an operational amplifier μA741, a sinewave oscillator and an integrated band-pass filter.

Słowa kluczowe

EN

global parametric fault; identification; artificial neural networks

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2009
• Tom: Vol. 16, nr 3
• Strony: 391--402
• Opis fizyczny: Bibliogr. 23 poz., rys., tab., wzory

Twórcy

autor

Jantos P.

autor

Grzechca D.

autor

Rutkowski J.

• Silesian University of Technology, Institute of Electronics, Faculty of Automatic Control, Electronics and Computer Science, Akademicka 16, 44-100 Gliwice, Poland,

Bibliografia

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